Microscopy: A Very Short Introduction Terence Allen
- PDF / 274,270 Bytes
- 1 Pages / 585 x 783 pts Page_size
- 49 Downloads / 206 Views
under different stress conditions. The concept of stress concentration based on stress intensity factor, energy release rate, and J-integral is also introduced based on different geometry and defect configurations. As noted by the author, the purpose of this book is to provide an introduction to damage and fracture mechanics suitable for undergraduates. The author has succeeded in accomplishing the scope and organizing the content in a very readable structure without losing any important information on this topic. Each chapter has sufficient figures/illustrations to
Microscopy: A Very Short Introduction Terence Allen Oxford University Press, 2015 144 pages, $11.95 ISBN 9780198701262
T
his book is indeed a short introduction; nevertheless, it is surprisingly complete. It is perfect reading for anyone who wants to extend their knowledge of microscopy but has little time. Because of its length, do not expect to learn in-depth details about microscopy techniques. In general, this book is mostly about optical (light) and electron microscopy. Both optical and electron microscopy are described very well. Beginners who plan to use these techniques can benefit from this book. It has a good blend and description of almost all modes of operation of these two microscopies. The book slightly touches on other advanced techniques, such as scanning probe and x-ray microscopy. The descriptions of these techniques could be improved by polishing facts and updating the information with recent advancements in those areas. It is unlikely that first-time learners can effectively use this book for the latter techniques. After a brief historical introduction to the world of optical and electron
microscopies (chapter 1), the book starts with a more detailed description of techniques behind optical and electron microscopy (chapter 2). Chapter 3 is an excellent description of the details of light microscopy, parts of an optical microscope, and advanced optical imaging modes, such as dark field and phase contrast, polarized light microscopy, and Nomarski mode. This chapter also touches upon ultraviolet and infrared microscopy, describing fluorescent microscopy and confocal and laser scanning confocal microscopies. It further describes ways to increase resolution by either some image post-processing (deconvolution) or by using several advanced methods commonly referred to as “super-resolution,” a recent development of light microscopy. Chapter 4 is entirely devoted to fluorescent microscopy and its use in biological and medical applications. Chapters 5 and 6 nicely describe transmission and scanning electron microscopies, respectively. Both chapters contain useful information about ways
help understand the information. There are worked examples in some chapters. The supplementary problems are taken from tutorials in the class, but there are no solutions provided, which encourages students to find the solution on their own with some hints. This book will be useful not only to students, but also junior engineers who frequently utilize these
Data Loading...
