Millimeter-Submillimeter Vector Measurements in Free Space, and in Resonant Structures. Application to Dielectrics Chara
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Goy page 1 of 12 MILLIMETER-SUBMILLIMETER VECTOR MEASUREMENTS IN FREE SPACE, AND IN RESONANT STRUCTURES. APPLICATION TO DIELECTRICS CHARACTERIZATION. Philippe GOY, Michel GROSS, Sylvain CAROOPEN, AB Millimètre, 52 rue Lhomond, 75005 Paris, France tel: 33 1 47077100, fax: 33 1 47077071, Email: [email protected] Juha MALLAT, Jussi TUOVINEN, Millimetre Wave Laboratory of Finland, Millilab, ESA external laboratory, Helsinki University of Technology, Radio Laboratory, P.O. Box 3000, FIN-02015 HUT, Finland, tel: 358 9 451 2247, fax: 358 9 451 2152, E-mail: [email protected] Alain MAESTRINI, Submillimeter Waves advanced technology group, J.P.L., mail stop 168-314, 4800 Oak Grove Drive, 91109-8099 Pasadena CA, tel: 818 354 5892, fax: 818 393 4683, Email: [email protected] Guiseppe ANNINO, Maria FITTIPALDI, Massimo MARTINELLI, Istituto di Fisica Atomica e Molecolare, CNR, 7 Via del Giardino, 56127 Pisa, Italy, tel: 39 050 3139029, fax: 39 050 3139036, Email: [email protected]
I. ABSTRACT. Usual vector measurements need to compare the signal detected through the Device Under Test DUT, with the signal coming directly from the source. Thanks to a very simple original method developed since 1989, vector detection can also be done with a purely electronic reference. In transmission experiments, there is no need for any directional coupler, and the frequency coverage extends from 8 to 1000 GHz. Quasi-optical propagation is used in the millimeter-submillimeter frequency range. Transmission through dielectric slabs in free space will give an easy measurement of the permittivity. Its real part will be obtained from the phase rotation, and its imaginary part from the amplitude decay. With dielectric coating deposited onto metal, the reflection method is necessary for the characterization. Low-loss materials are characterized with the open cavity perturbation technique. Extremely low loss materials can constitute "whispering gallery" resonators, very easy to excite and characterize. II. VECTOR MEASUREMENTS WITHOUT DIRECTIONAL COUPLER. All Vector Network Analyzers VNAs working in the millimeter bands make use of Schottky diode devices as sources (by frequency multiplication, rank N1, from a source S1 at frequency F1, with a phase noise Φ1) and as detectors (by harmonic mixing, rank N2, with a source S2 at frequency F2, with a phase noise Φ2, as Local Oscillator LO). At detection, the IF frequency Fif and the phase noise Φ will be:
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Fif = N1 F1 - N2 F2 Φ = N1 Φ1 - N2 Φ2
(1) (2)
In ordinary VNAs, Fif is tuned at the heterodyne receiver frequency by an appropriate choice of N1 and N2, with N1≠N2, and a precise determination of F1 and F2, involving at least a microwave synthesizer. The phase noise Eq.(2) is eliminated in the heterodyne receive
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