Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultra
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Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C60 tip V. Blank and M. Popov Research Center for Superhard Materials, Troitsk, Moscow reg., 142092, Russia and Institute of Spectroscopy of the Russian Academy of Sciences, Troitsk, Moscow reg., 142092, Russia
N. Lvova Institute of Spectroscopy of the Russian Academy of Sciences, Troitsk, Moscow reg., 142092, Russia
K. Gogolinsky High Technology Electronics, Zelenograd, Moscow K-681, P.O. Box 6, 103681, Russia
V. Reshetov Moscow Physical Engineering Institute, Moscow, 115409, Russia (Received 17 July 1996; accepted 8 May 1997)
The new procedure for the hardness measurements of superhard materials including diamond using the scanning force microscope with the ultrahard fullerite C60 tip was developed. It is shown that diamond is plastically deformed under the indentation by the ultrahard fullerite indenter at room temperature. Now the correct measurements of diamond hardness have become possible. The hardness values measured are 137 ± 6 and 167 ± 5 GPa for the diamond faces (100) and (111), respectively.
I. INTRODUCTION
Recently a study of mechanical properties of materials on a submicron length scale has become of interest to many investigators. In particular, the problem of the submicron hardness tests exists for thin films and fibers, for the nanophase, and for composite materials. The procedure of these tests was developed in recent years. The measurements are performed using the special hardness testers at the submicro- and nanometer scales which are suitable for measuring hardness against penetration depth.1–6 In addition, an indentation size is controlled with scanning or transmission electron microscopy, or scanning force microscopy (SFM). Performing of the direct hardness measurements using the SFM is possible without any additional equipment.7 Plasticity of brittle materials and a possibility of a crack-free indentation on the submicron length scale1 make the procedure of the submicron hardness measurements available for superhard materials, especially for diamond, whereas earlier the plasticity of diamond at room temperature as well as results of the hardness measurements were doubtful.8 An extra opportunity for carrying out these tests appears with use of ultrahard fullerite C60 as the indenter material. The synthesis conditions of this material and investigation of its structure by x-ray powder diffractometry and Raman scattering were described in Refs. 9 and 10. Theoretical prediction of anomalously high mechaniJ. Mater. Res., Vol. 12, No. 11, Nov 1997
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cal properties of the fullerite C60 phase, characterized by the intermolecular distances matching the intramolecular distances of C-C bonds, is given in Ref. 11. The NanoScan (NS) measurement system based upon the principles of the SFM is used in the present study for hardness measurements of superhard materials an
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