Parametric Models Based on Sensitivity Analysis for Passive Components
Passive components with significant high frequency field effects have to be modeled taking into consideration full wave electromagnetic field equations. Such a field formulation with appropriate electromagnetic circuit element boundary conditions is numer
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Abstract Passive components with significant high frequency field effects have to be modeled taking into consideration full wave electromagnetic field equations. Such a field formulation with appropriate electromagnetic circuit element boundary conditions is numerically analyzed in the time domain with the finite integral technique, a sparse state-space representation of the component being obtained. The novelty of the presented approach is the use of model parameterization and the extraction of the model sensitivities needed by parametric model order reduction procedures. The paper investigates the validity of first order Taylor Series expansion with respect to the parameters as approximation for the extracted semi-state space models.
1 Introduction An extremely important RF design activity is the post-layout verification step. It entails the accurate prediction of the behaviour of the chip after each design iteration, but before actual production. Trying to correct a design through trial and error of silicon implementation is far too costly and far too slow in view of the economics and decreased time to market. Therefore, it is crucial to have a state-of-the-art procedure for the design verification of future RFICs up to 60 GHz. Such procedure needs accurate models for passive components, able to describe all relevant electromagnetic field effects inside the devices. Moreover, in order to allow the connection of these models to the rest of the circuit, robust and efficient methods are needed for extraction of parameterized reduced order models able to take into account the Gabriela Ciuprina, Daniel Ioan, and Dragos Niculae “Politehnica” University, Spl Independentei 313, 060042 Bucharest, Romania [email protected] Jorge Fern´andez Villena and L. Miguel Silveira INESC-ID/IST – Technical University of Lisbon, Rua Alves Redol, 9, 1000-029 Lisboa, Portugal [email protected], [email protected] G. Ciuprina et al.: Parametric Models Based on Sensitivity Analysis for Passive Components, Studies in Computational Intelligence (SCI) 119, 231–239 (2008) c Springer-Verlag Berlin Heidelberg 2008 www.springerlink.com
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variability induced by lithography or process variations as well as changing operating conditions. This is one of the issues addressed by the FP6/CHAMELEON-RF project [1]. Efficient methodologies to extract compact parametric models of passive components valid for parameter variations were developed based on the effective adjoint field technique (AFT) and adjoint circuit technique (ACT) [2, 3]. An alternative to the adjoint techniques is to compute the sensitivities of the semi-state space matrices directly from the discretized model, to use Taylor Series (TS) expansion w.r.t. the variable parameters, and to apply appropriate model order reduction procedures in the time-domain [4]. This paper investigates the validity of first order Taylor Series expansion with respect to the parameter as approximation for the extracted semistate space models.
2 Parametric Full Wave Models with FIT The elect
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