Physics of Laser Materials Processing Theory and Experiment
This book describes the basic mechanisms, theory, simulations and technological aspects of Laser processing techniques. It covers the principles of laser quenching, welding, cutting, alloying, selective sintering, ablation, etc. The main attention is paid
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		    materials science
 
 146
 
 Springer Series in
 
 materials science Editors: R. Hull C. Jagadish R.M. Osgood, Jr. J. Parisi Z. Wang The Springer Series in Materials Science covers the complete spectrum of materials physics, including fundamental principles, physical properties, materials theory and design. Recognizing the increasing importance of materials science in future device technologies, the book titles in this series ref lect the state-of-the-art in understanding and controlling the structure and properties of all important classes of materials.
 
 Please view available titles in Springer Series in Materials Science on series homepage http://www.springer.com/series/856
 
 Gennady G. Gladush Igor Smurov
 
 Physics of Laser Materials Processing Theory and Experiment
 
 With 514 Figures
 
 123
 
 Gennady G. Gladush Troitsk Institute for Innovation and Fusion Research Pushovikh str., Vladenie 12, 142190 Troitsk, Moscow region, Russia and Institute on Laser and Information Technologies RAS 1 Svyatoozerskaya St., 140700 Shatura, Moscow Region, Russia E-mail: [email protected]
 
 Igor Smurov Ecole Normale Sup´erieure de St-Etienne, DIPI Laboratory Rue Jean Parot 58, 42023 Saint-Etienne, France E-mail: [email protected]
 
 Series Editors:
 
 Professor Robert Hull
 
 Professor J¨urgen Parisi
 
 University of Virginia Dept. of Materials Science and Engineering Thornton Hall Charlottesville, VA 22903-2442, USA
 
 Universit¨at Oldenburg, Fachbereich Physik Abt. Energie- und Halbleiterforschung Carl-von-Ossietzky-Straße 9–11 26129 Oldenburg, Germany
 
 Professor Chennupati Jagadish
 
 Dr. Zhiming Wang
 
 Australian National University Research School of Physics and Engineering J4-22, Carver Building Canberra ACT 0200, Australia
 
 University of Arkansas Department of Physics 835 W. Dicknson St. Fayetteville, AR 72701, USA
 
 Professor R. M. Osgood, Jr. Microelectronics Science Laboratory Department of Electrical Engineering Columbia University Seeley W. Mudd Building New York, NY 10027, USA
 
 Springer Series in Materials Science ISSN 0933-033X ISBN 978-3-642-19242-5 e-ISBN 978-3-642-19831-1 DOI 10.1007/978-3-642-19831-1 Springer Heidelberg Dordrecht London New York Library of Congress Control Number: 2011934865 © Springer-Verlag Berlin Heidelberg 2011 This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specif ically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microf ilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer. Violations are liable to prosecution under the German Copyright Law. The use of general descriptive names, registered names, trademarks, etc. in this publication does not imply, even in the absence of a specif ic statement, that such names are exempt from the relevant protective laws and regulations and		
 
	 
	 
	 
	 
	 
	 
	 
	 
	 
	 
	