Progress in Pattern Recognition, Image Analysis and Applications 9th
First of all, we want to congratulate two new research communities from M- ico and Brazil that have recently joined the Iberoamerican community and the International Association for Pattern Recognition. We believe that the series of congresses that starte
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Editorial Board David Hutchison Lancaster University, UK Takeo Kanade Carnegie Mellon University, Pittsburgh, PA, USA Josef Kittler University of Surrey, Guildford, UK Jon M. Kleinberg Cornell University, Ithaca, NY, USA Friedemann Mattern ETH Zurich, Switzerland John C. Mitchell Stanford University, CA, USA Moni Naor Weizmann Institute of Science, Rehovot, Israel Oscar Nierstrasz University of Bern, Switzerland C. Pandu Rangan Indian Institute of Technology, Madras, India Bernhard Steffen University of Dortmund, Germany Madhu Sudan Massachusetts Institute of Technology, MA, USA Demetri Terzopoulos New York University, NY, USA Doug Tygar University of California, Berkeley, CA, USA Moshe Y. Vardi Rice University, Houston, TX, USA Gerhard Weikum Max-Planck Institute of Computer Science, Saarbruecken, Germany
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Alberto Sanfeliu José Francisco Martínez Trinidad Jesús Ariel Carrasco Ochoa (Eds.)
Progress in Pattern Recognition, Image Analysis and Applications 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004 Puebla, Mexico, October 26-29, 2004 Proceedings
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Volume Editors Alberto Sanfeliu Universitat Politècnica de Catalunya Institut de Robòtica i Informàtica Industrial (IRI) Dept. d’Enginyeria de Sistemas, Automàtica e Informàtica Industrial (ESAII) Parc Tecnològic de Barcelona, Edifici U St. Llorens i Artigas 4-6, 08028 Barcelona, Spain E-mail: [email protected] José Francisco Martínez Trinidad Jesús Ariel Carrasco Ochoa National Institute of Astrophysics, Optics and Electronics (INAOE) Computer Science Department Luis Enrique Erro No. 1, 72840 Sta. Maria Tonantzintla, Puebla, Mexico E-mail: {fmartine, ariel}@inaoep.mx
Library of Congress Control Number: 2004113938 CR Subject Classification (1998): I.5, I.4, I.2.10, I.2.7 ISSN 0302-9743 ISBN 3-540-23527-2 Springer Berlin Heidelberg New York This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, re-use of illustrations, recitation, broadcasting, reproduction on microfilms or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer. Violations are liable to prosecution under the German Copyright Law. Springer is a part of Springer Science+Business Media springeronline.com © Springer-Verlag Berlin Heidelberg 2004 Printed in Germany Typesetting: Camera-ready by author, data conversion by Olgun Computergrafik Printed on acid-free paper SPIN: 11335887 06/3142 543210
Preface
First of all, we want to congratulate two new research communities from Mexico and Brazil that have recently joined the Iberoamerican community and the International Association for Pattern Recognition. We believe that the series of congresses that started as the “Taller Iberoamericano de Reconocimiento de Patrones (TIARP)”, and later became the “Iberoamerican Co
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