In-situ Materials Characterization Across Spatial and Temporal Scale
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fas
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Alexander Ziegler Heinz Graafsma Xiao Feng Zhang Joost W. M. Frenken Editors
In-situ Materials Characterization Across Spatial and Temporal Scales
Springer Series in Materials Science Volume 193
Series editors Robert Hull, Charlottesville, VA, USA Chennupati Jagadish, Canberra, ACT, Australia Richard M. Osgood, New York, NY, USA Jürgen Parisi, Oldenburg, Germany Zhiming M. Wang, Chengdu, P.R. China
For further volumes: http://www.springer.com/series/856
The Springer Series in Materials Science covers the complete spectrum of m aterials physics, including fundamental principles, physical properties, materials theory and design. Recognizing the increasing importance of materials science in future device technologies, the book titles in this series reflect the state-of-the-art in understanding and controlling the structure and properties of all important classes of materials.
Alexander Ziegler · Heinz Graafsma Xiao Feng Zhang · Joost W. M. Frenken Editors
In-situ Materials Characterization Across Spatial and Temporal Scales
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Editors Alexander Ziegler Microscopy and Microanalysis Unit The University of the Witwatersrand Johannesburg South Africa
Xiao Feng Zhang Hitachi High Technologies America, Inc. Nanotechnology Systems Division Pleasanton, CA USA
Heinz Graafsma Photon-Science Detector Group Deutches Elektronen-Synchrotron, DESY Hamburg Germany
Joost W. M. Frenken Kamerlingh Onnes Laboratory Leiden University Leiden The Netherlands
ISSN 0933-033X ISSN 2196-2812 (electronic) ISBN 978-3-642-45151-5 ISBN 978-3-642-45152-2 (eBook) DOI 10.1007/978-3-642-45152-2 Springer Heidelberg New York Dordrecht London Library of Congress Control Number: 2014934837 © Springer-Verlag Berlin Heidelberg 2014 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. Exempted from this legal reservation are brief excerpts in connection with reviews or scholarly analysis or material supplied specifically for the purpose of being entered and executed on a computer system, for exclusive use by the purchaser of the work. Duplication of this publication or parts thereof is permitted only under the provisions of the Copyright Law of the Publisher’s location, in its current version, and permission for use must always be obtained from Springer. Permissions for use may be obtained through RightsLink at the Copyright Clearance Center. Violations are liable to prosecution under the respective Copyright Law. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective
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