Reflectance imaging spectroscopy in heritage science

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Reflectance imaging spectroscopy in heritage science J. Striova1 · A. Dal Fovo1 · R. Fontana1 Received: 7 September 2020 / Accepted: 30 October 2020 / Published online: 2 November 2020 © Società Italiana di Fisica 2020

Abstract The present paper focuses on the reflectance spectral imaging of painted surfaces in the visible-near infrared spectral region (400–2500 nm). Other spectral ranges and methods are mentioned, to contextualize the spectral investigation of works of art.

Contents 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Spectroscopy: from lab to remote sensing . . . . . . . . . . . 2.1 Development of imaging spectroscopy in heritage science 3 Instrumental set-ups for imaging spectroscopy . . . . . . . . 3.1 Wavelength filtering . . . . . . . . . . . . . . . . . . . . 3.2 Wavelength dispersion . . . . . . . . . . . . . . . . . . 3.3 Whisk- and Push-broom Scanners . . . . . . . . . . . . 3.4 Detectors . . . . . . . . . . . . . . . . . . . . . . . . . 4 Measured quantity . . . . . . . . . . . . . . . . . . . . . . . 4.1 Reflectance . . . . . . . . . . . . . . . . . . . . . . . . 4.2 Reflectance spectroscopy . . . . . . . . . . . . . . . . . 5 RIS in multimodal analyses . . . . . . . . . . . . . . . . . . 5.1 Point and areal analyses of painting materials . . . . . . 5.2 Two-dimensional imaging of hidden details . . . . . . . 5.3 3D and cross-sectional survey . . . . . . . . . . . . . . . 6 Future perspectives . . . . . . . . . . . . . . . . . . . . . . . References . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Abbreviations μXRF 2D 3D ANN APD B

B 1

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517 519 521 524 524 526 528 530 531 531 534 538 538 549 553 557 558

Micro-X-Ray Fluorescence Two-dimensional Three-dimensional Artificial neural network Avalanche photodiode Blue

J. Striova [email protected] National Research Council, National Institute of Optics (CNR-INO), Florence, Italy

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516

BR-RIS CCD EDS EMCCD FORS FOV FPA FT FT-IR FWHM G HS HS-RIS HSI ICCD InGaAs IRR IS LWIR MA-XRF MA-XRF-SR MB MCD MCT MNF MS MS-RIS MSI MWIR NG NIR OCT OPD PAI PCA PD PLM PMT R RF RIS RTI SCD SAM SCM sCMOS

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J. Striova et al.

Broad spectral range reflectance imaging spectroscopy Charge-coupled device Energy dispersive spectroscopy Electron-multiplying CCD Fiber optics reflectance spectroscopy Field of view Focal plane array Fourier transform Fourier transform infrared Ful