Research Resources
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r Flash Thermal Diffusivity System: The fully automated laser flash apparatus is designed for determining thermal properties of materials up to 2000°C. The instrument calculâtes and outputs thermal diffusivity, spécifie heat, and thermal conductivity of advanced materials, including high-temperature ceramics, composites, plastics, graphites, and heat-resistant metals and alloys. Only a small test sample, 10 mm diameter by 1 to 3 mm thick, is required. The laser flash cornes with a built-in microprocessor which controls the vacuum, valve sequencing, heating, and laser Systems, as well as data acquisition and analysis. The System cornes with sophisticated menu-driven software along with a unique furnace design. Holometrix, Inc., 99 Erie St., Cambridge MA 02139; (617) 868-8050.
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Scanning Force Microscope and New Scanning Tunneling Microscope Literature: Literature describes the Model SFM-BD2 scanning force microscope and Model STM-SA1 scanning tunneling microscope instruments that operate in air rather than under vacuum. Thèse instruments provide greater resolution across a wider range of conditions than the best optical or scanning électron microscopes currently available. Park Scientific Instruments, 476 Ellis Street, Mountain View, CA 94043; (415) 965-2946. 2-4 Micron Thin Silicon Membranes
Infrared Bakeout Lamp and Controller: Infrared bakeout lamp and controller quickly and uniformly bake out vacuum chambers. The infrared lamp is put directly into the vacuum chamber, where the stainless steel chamber walls absorb the heat that is produced by the light in the infrared range. The whole chamber, including any parts hanging inside, is rapidly heated by direct orreflectedinfrared rays. Gases and moisture are more quickly released, and the chamber can be pumped down to a lower vacuum much faster. The heat applied from the inside of the chamber is slow to diffuse out, resulting iri a faster, more uniform bakeout. For certain applications, the infrared lamp can be fitted with a linear motion feedthrough to enable it to be retracted from the chamber cavity after bakeout without breaking vacuum. A shutter device can be added to shield this port from a sputter source. Huntington Mechanical Laboratories, Inc., 1040 L'Avenida, Mountain View, CA 94043; (415) 964-3323 or (800) 227-8059.
Spectroradiometer System: The IL Solar Hazard Détection System features a 1 billion to 1 rejection ratio of the sun's visible and infrared irradiance which can interfère with measurements in the chemically and biologically active région. (According to the manufacturer, this ratio is 1,000 times greater than previously thought attainable.) The System is capable of accurately measuring shorter wavelengths down to 200 nm, making it possible for the System to isolate UV hazard radiation. The System can conduct studies in thé carcinogenic zone of radiation (200 nm to 310 mm) which is greatly affected by ozone absorption and is equally well suited for evaluating the impact of solar dégradation on materials. International Light, Inc., 17 Graf Rd.,
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