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Housings for Rolled Filters: A free
High-Temperature Imaging Pyrometer: Mikron Instruments' M9000 Series features a solid-state detector array camera and operates in the near-IR spectrum to minimize measurement errors. The device offers a 640 x 480 pixel image for high resolution and a temperature range of 500-3000°C. A 30-frames-persecond response permits real-time imaging of dynamic processes. Four levels of system modularity enable users to choose from a basic detector unit and video processor for calibrated imaging to a multirange, computerized turnkey system. Circle No. 60 on Reader Service Card.
Thin Film Measurement System: Pacific Lightwave's TMS-10 complete turnkey system can be used to automatically measure thickness, refraction index, and absorption of dielectric films used in silicon, III-V, and LCD fabrication. The system also models and characterizes complex multilayer optoelectronic structures. The TMS-10 can be configured for patterned or unpatterned films, and for in situ measurements. Windows-based software is standard, with Macintosh-based versions available. Circle No. 64 on Reader Service Card. Ellipsometer Software: FilmEllipse from Scientific Computing International facilitates analysis and acquisition of ellipsometric data. Users can find solutions to applications not typically covered by software bundled with commercially available ellipsometers. The software combines ellipsometric and spectrophotometric data collected at multiple wavelengths and angles of incidence to simultaneously solve for complex indices (n + ik) and thicknesses of multilayer film structures. Experimental data, solutions, and user-defined fields are automatically saved and grouped for later analysis. Circle No. 68 on Reader Service Card.
Raman Imaging
Microscope:
Renishaw offers a microscope that combines scanning spectroscopy and 2-D imaging in one system. The instrument scans to a spatial resolution of 1 um and a spectral resolution to 0.2 cm"1, providing graphic output in the form of 2-D Raman images, and 2-D and 3-D spectral plots. The standard microscope uses a 25 mW laser and has a scanning range of 200^000 cm"1. Optional extensions provide ranges of 100-4000 cm"1 and 5000-7000 cm1. Users can customize the instrument for remote analysis, high-temperature measurement up to 1500°C, lowtemperature measurement down to 4 K, and large-area scanning without stitching. Circle No. 67 on Reader Service Card.
Portable Excimer Laser Machining System: The LightDeck system from OPTEC enables researchers to use excimer lasers to investigate the interaction of uv light on materials in applications such as surface modification, surface cleaning, material activation, annealing, or thin film deposition. The PC-controlled system measures 500 x 600 mm2, but is compatible with most excimer laser sources. Features include a folded optic rail, automatic demagnification control, optic position indicators, beam homogenization, and a confocal vision system. Circle No. 62 on Reader Service Card.
Liquid Nitrogen Level Controller: Tera
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