Scan Statistics Methods and Applications
Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetic
- PDF / 5,882,604 Bytes
- 410 Pages / 524.395 x 733.818 pts Page_size
- 25 Downloads / 222 Views
Joseph Glaz Vladimir Pozdnyakov Sylvan Wallenstein Editors
Scan Statistics Methods and Applications
B i r k h ä u s e r
Statistics for Industry and Technology
Series Editor N. Balakrishnan McMaster University Department of Mathematics and Statistics 1280 Main Street West Hamilton, Ontario L8S 4K1 Canada
Editorial Advisory Board Max Engelhardt EG&G Idaho, Inc. Idaho Falls, ID 83415 Harry F. Martz Group A-1 MS F600 Los Alamos National Laboratory Los Alamos, NM 87545 Gary C. McDonald NAO Research & Development Center 30500 Mound Road Box 9055 Warren, MI 48090-9055 Kazuyuki Suzuki Communication & Systems Engineering Department University of Electro Communications 1-5-1 Chofugaoka Chofu-shi Tokyo 182 Japan
Scan Statistics Methods and Applications
Joseph Glaz Vladimir Pozdnyakov Sylvan Wallenstein Editors
Birkh¨auser Boston • Basel • Berlin
Editors Joseph Glaz Department of Statistics, U-4120 University of Connecticut 215 Glenbrook Rd. Storrs, CT 06269-4120, USA [email protected]
Vladimir Pozdnyakov Department of Statistics, U-4120 University of Connecticut 215 Glenbrook Rd. Storrs, CT 06269-4120, USA [email protected]
Sylvan Wallenstein Department of Community & Preventive Medicine Box 1057 Mount Sinai School of Medicine 1 Gustave Levy Place New York, NY 10029, USA [email protected]
ISBN 978-0-8176-4748-3 e-ISBN 978-0-8176-4749-0 DOI 10.1007/978-0-8176-4749-0 Library of Congress Control Number: 2009926299 Mathematics Subject Classification (2000): 60C05, 60D05, 60G30, 60G35, 60G55, 60G63, 60G70, 60J22, 60M02, 62P10, 62P12, 62P25, 62P30, 62M30, 62N05 c Birkh¨auser Boston, a part of Springer Science+Business Media, LLC 2009 All rights reserved. This work may not be translated or copied in whole or in part without the written permission of the publisher (Birkh¨auser Boston, c/o Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden. The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights.
Printed on acid-free paper Birkh¨auser Boston is part of Springer Science+Business Media (www.birkhauser.com)
In honor of Joseph I. Naus
Contents
Preface
xv
Contributors
xvii
List of Tables
xxi
List of Figures
xxv
1 Joseph Naus: Father of the Scan Statistic S. Wallenstein 1.1 1.2
Naus (1963): Ph.D. Thesis . . . . . . . . . . . . . . . . . . . . The Early Papers Touching All Aspects of the Problem: 1965–1968 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.2.1 Maximum cluster of points on a line, Naus (1965a) . . 1.2.2 Clustering in two dimensions, Naus (1965b) . . . . . . 1.2.3 Power comparisons,
Data Loading...
