Scanning-Digital Image Correlation for Moving and Temporally Deformed Surfaces in Scanning Imaging Mode
- PDF / 5,713,744 Bytes
- 23 Pages / 595.276 x 790.866 pts Page_size
- 115 Downloads / 194 Views
RESEARCH PAPER
Scanning-Digital Image Correlation for Moving and Temporally Deformed Surfaces in Scanning Imaging Mode H. Xie 1,2 & Z. Wang 1,2 & J. Liang 1,2 & X. Li 1,2 Received: 27 August 2019 / Accepted: 7 July 2020 # Society for Experimental Mechanics 2020
Abstract Background Images from scanning electron microscopes, transmission electron microscopes and atomic force microscopes have been widely used in digital image correlation methods to obtain accurate full-field deformation profiles of tested objects and investigate the object’s deformation mechanism. However, because of the raster-scanning imaging mode used in microscopic observation equipment, the images obtained from these instruments can only be used for quasi-static displacement measurements; otherwise, spurious displacements and strains may be introduced into the deformation results if these scanning microscopic images are used directly in general digital image correlation calculations for moving and temporally deformed surfaces. Objective Realizing kinematic parameter and dynamic deformation measurements on a scanning electron microscope platform. Methods Establishing a scanning imaging model of moving and temporally deformed objects that contains motion and deformation equations, a scanning equation and an intensity invariance assumption for small deformations. Then proposing a scanning-digital image correlation (S-DIC) method based on combing the characteristics of the scanning imaging mode with digital image correlation. Results Quantitatively investigating the effects of the spurious displacements and strains introduced when using scanning images to represent moving and temporally deformed surfaces in the measurement results. Numerical simulations verify that the accuracy of the S-DIC method is 10−2pix for the displacement, 10−4 for the strain, 10−4pix/s for the velocity and 10−6s−1 for the strain rate. Experiments also show that the proposed S-DIC method is effective. Conclusions: The results of this work demonstrate the utility of S-DIC on the field of microscopic dynamic measurement. Keywords Digital image correlation . Scanning imaging . Scanning electron microscope . Dynamic deformation . Kinematic measurement
Introduction Digital image correlation (DIC) has found widespread use and acceptance as a tool for surface deformation measurements in many scientific research fields and engineering applications [1]. In particular, with the recent increase in demand for quantitative deformation measurements at the micro- and nanoscales, the DIC method has been combined with scanning imaging instruments such as the scanning * X. Li [email protected] 1
Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China
2
Center for Nano and Micro Mechanics, Tsinghua University, Beijing 100084, China
electron microscope (SEM), the scanning tunneling microscope (STM) and the atomic force microscope (AFM). This combination allows users to obtain displacements with nanometer resolution and strain fields that could then be used to s
Data Loading...
