Secondary Particle Generation with Accelerators
The beam-matter interaction results in a multitude of secondary particles. These particles bear information useful for analytical method and the potential for applications through their controlled generation. The knowledge of their emission physics result
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Accelerator Technology Applications in Science, Medicine, and Industry
Particle Acceleration and Detection Series Editors Alexander Chao, SLAC, Stanford University, Menlo Park, CA, USA Frank Zimmermann, BE Department, ABP Group, CERN, Genève, Switzerland Katsunobu Oide, KEK, High Energy Accelerator Research Organization, Tsukuba, Japan Werner Riegler, Detector group, CERN, Genève, Switzerland Vladimir Shiltsev, Accelerator Physics Center, Fermi National Accelerator Lab, Batavia, IL, USA Kenzo Nakamura, Kavli IPMU, University of Tokyo, Kashiwa, Chiba, Japan
The series “Particle Acceleration and Detection” is devoted to monograph texts dealing with all aspects of particle acceleration and detection research and advanced teaching. The scope also includes topics such as beam physics and instrumentation as well as applications. Presentations should strongly emphasize the underlying physical and engineering sciences. Of particular interest are – contributions which relate fundamental research to new applications beyond the immediate realm of the original field of research – contributions which connect fundamental research in the aforementioned fields to fundamental research in related physical or engineering sciences – concise accounts of newly emerging important topics that are embedded in a broader framework in order to provide quick but readable access of very new material to a larger audience The books forming this collection will be of importance to graduate students and active researchers alike.
More information about this series at http://www.springer.com/series/5267
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Accelerator Technology Applications in Science, Medicine, and Industry
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Sören Möller Forschungszentrum Jülich GmbH Jülich, Germany
ISSN 1611-1052 ISSN 2365-0877 (electronic) Particle Acceleration and Detection ISBN 978-3-030-62307-4 ISBN 978-3-030-62308-1 (eBook) https://doi.org/10.1007/978-3-030-62308-1 © Springer Nature Switzerland AG 2020 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, expressed or implied, with respect to the material contained herein or for any errors or omissions that may
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