XPS Studies of the Si/SiO 2 Interface with Synchrotron Radiation

  • PDF / 2,117,572 Bytes
  • 12 Pages / 415.8 x 637.2 pts Page_size
  • 27 Downloads / 160 Views

DOWNLOAD

REPORT

ABSTRACT Si 2p core-level spectroscopy is a unique tool to determine the chemical composition and spatial extension of the suboxide layer present at the Si/SiO 2 interface. In the case of ultra-thin oxide films (thickness

Data Loading...

Recommend Documents
Synchrotron Radiation

189 19 21MB

Investigation of Amorphous InGaZnO Based TFT Interface Properties with Synchrotron Radiation Analysis

144 60 216KB

Synchrotron Radiation Fundamentals

190 65 16MB

Biophysics and Synchrotron Radiation

216 43 18MB

AES and XPS Studies of the Chemical Effects at the Magneto-Optic/Dielectric Interface

160 10 343KB

Magnetism and Synchrotron Radiation

206 23 7MB

Studies of Polymers with Radiation

143 38 305KB

XPS Studies of the Interface Properties of Conductive Adhesive/Eutectic Solder

140 78 1MB

Studies of Alq/Mg: Ag Interface in Organic Light-Emitting Diodes by XPS

161 64 136KB

Magnetism: A Synchrotron Radiation Approach

246 77 15MB

History and Science of Research with Synchrotron Radiation

235 35 2MB

European Synchrotron Radiation Facility (ESRF)

187 15 23MB