AFM examination of nanolayers synthesised by the molecular layering method on the surface of manufacturing glasses
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HE 8th INTERNATIONAL WORKSHOP ON BEAM INJECTION ASSESSMENT OF MICROSTRUCTURES IN SEMICONDUCTORS, JUNE 11–14, 2006, ST. PETERSBURG, RUSSIA
AFM Examination of Nanolayers Synthesised by the Molecular Layering Method on the Surface of Manufacturing Glasses1 E. A. Sosnova, V. P. Dorofeeva, A. A. Malkova, A. A. Malygina, N. A. Kulikovb, and G. L. Brusilovskyb aSt.
Petersburg State Technological Institute, St. Petersburg, 198013 Russia b“Svetlana-Roentgen” JSC, St. Petersburg, Russia Submitted September 12, 2006; accepted for publication October 3, 2006
Abstract—The surface topography of glass matrixes is investigated before and after oxide coatings caused by the molecular layering method. The conductance of synthesized nanolayers is investigated. PACS numbers: 68.37.Ps, 81.15.Kk, 81.16.Be, 81.40.Ef DOI: 10.1134/S1063782607050028
1. INTRODUCTION The problem of preparing high-voltage electronic devices with high electric strength remains topical [1–3]. In devices designed for operating at tens and hundreds of kV, the dielectric glass shell is the most important element determining the electrical strength of the device [4]. Examination of initiation of a voltage failure in X-ray tubes has revealed emersion of a parasitic secondary auto electronic emission from the electrodes, greatly reducing the strength of the glass balloons. One of the reasons specified is, apparently, accumulation of static charge on microcracks at the glass shell interior surface of X-ray tubes [2]. One of the expedients of raising the electric strength of high-voltage X-ray devices, making concerning “thick” (tens micron) dielectric coats of oxides on an interior surface of glass shells is now in use [5]. At the same time, modern demands on X-ray tubes force us to search for more effective methods of preparing oxide overlay with optimal thickness and uniform coating on tubes of any geometrical shape. In order to solve the above problem, the use of precision synthesis of surface nanostructures by the method of molecular layering seems to be promising [6–8]. Compared to the traditional thin-film technologies, the method of molecular layering offers a number of advantages, such as accuracy in specifying the composition and thickness of the layer on the atomic and molecular levels, the formation of strong (chemical) bonds between the coating and the surface of the matrix, and a uniform distribution of modifying materials over the surface irrespective of its geometric configuration [8, 9]. The developed approaches were imple1 The
mented earlier when using the molecular layering method for synthesizing titanium oxide nanolayers in order to heal microdefects of glass microspheres [10] and pores in silica glasses [11, 12], which ensured a considerable decrease in the number of surface defects and an enhancement of the hydrostatic strength, respectively. In the present work, we study the surface topography of glass matrixes before and after oxide coatings caused by the molecular layering method, and investigate the conductance of synthesized nanolayers. 2.
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