Apertureless head: a multipurpose tool really combining atomic force microscopy with powerful means for optical investig
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Apertureless head: a multipurpose tool really combining atomic force microscopy with powerful means for optical investigations. Vasily V. Gavrilyuk, Serguey A. Saunin, Vladimir V. Zhizhimontov, Victor V. Baukov NTMDT Company, Zelenograd, Moscow, Russian Federation ABSTRACT An original instrument intended to integrate the advantages of scanning probe, near and far field optical microscopy is presented. The device named Apertureless Head was specially designed to be incorporated to Ntegra scanning probe laboratory, the powerful analytical instrumentation in the nanotechnology field produced by NT-MDT Company, Russia. The device is supposed to be a powerful tool for high resolution analysis in different fields of investigations such as material sciences (optical and optoelectronic, magnetic, semi- and superconducting materials), polymers and biological sciences (structural biology, molecular and cell biology, microbiology, etc.). Probe tip plane light distributions are calculated and different light propagation schemes are discussed. MAIN OPERATION MODES AH can work as a standard atomic force scanning microscope. Principal optical scheme of the realization of this operating mode is CCD video camera presented at figure1. Being equipped with high numerical aperture objective, AH allows illumination and observation of the Imaging optics sample in the proximity of the probe and under the cantilever as well. The working distance of objective is large enough to Excitation light Beam splitter 2 accommodate the cantilever holder with Scattered light piezo driver in the space between the frontal meniscus and the sample. Laser system monitoring the cantilever deflections and oscillations is equipped with suitable optics allowing its work Beam splitter 1 Laser through the objective. Beam splitters deflectometer allows optical observation of the sample during the scanning, providing possibility of exact positioning of scanning High power high NA AFM probe microscope probe to the object under objective investigation regardless non transparency Sample of the probe (see fig.2.). The cantilever is XYZ stage shown not sharply at the bottom of photographs as a blurred triangle. Pieces Figure 1. AFM mode apertureless head principal of dust are seen under the probe as if the optical scheme. cantilever being transparent due to the
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Cantilever tip apex 10 µm
Pieces of dust on the sample surface.
Figure.2. Sample being seen “through the cantilever tip”. Photographs are taken from the monitor screen during the scanning process. inclined rays collected by the objective. Probe holder unit of the head is made exchangeable. AH can work as a Scanning Tunneling Microscope with a suitable probe holder unit allowing an optical investigation of the sample surface with the resolution of 0.4 micrometer in the proximity of the probe apex as well as in AFM mode. Specially designed probe holder does not shade significantly the field of vision. The tool can be used as a confocal microscope allowing light absorption, fluorescence or scatte
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