Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Se
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imagin
- PDF / 11,949,919 Bytes
- 350 Pages / 429.725 x 659.895 pts Page_size
- 112 Downloads / 206 Views
Hui Xie, Cagdas Onal, Stéphane Régnier, and Metin Sitti
Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments
ABC
Professor Bruno Siciliano, Dipartimento di Informatica e Sistemistica, Università di Napoli Federico II, Via Claudio 21, 80125 Napoli, Italy, E-mail: [email protected] Professor Oussama Khatib, Artificial Intelligence Laboratory, Department of Computer Science, Stanford University, Stanford, CA 94305-9010, USA, E-mail: [email protected] Professor Frans Groen, Department of Computer Science, Universiteit van Amsterdam, Kruislaan 403, 1098 SJ Amsterdam, The Netherlands, E-mail: [email protected]
Authors Dr. Hui Xie Institut des Systèmes Intelligents et de Robotique Université Pierre et Marie Curie BC 173, 4 Place Jussieu 75005 Paris France E-mail: [email protected]
Prof. Stéphane Régnier Institut des Systèmes Intelligents et de Robotique Université Pierre et Marie Curie BC 173, 4 Place Jussieu 75005 Paris France E-mail: [email protected]
Dr. Cagdas Onal Computer Science and Artificial Intelligence Laboratory Massachusetts Institute of Technology 32 Vassar St. 32-375 02139 Cambridge USA E-mail: [email protected]
Prof. Metin Sitti NanoRobotics Lab Carnegie Mellon University 5000 Forbes Ave 320 Scaife Hall 15213-3890 Pittsburgh USA E-mail: [email protected]
ISBN 978-3-642-20328-2
e-ISBN 978-3-642-20329-9
DOI 10.1007/978-3-642-20329-9 Springer Tracts in Advanced Robotics
ISSN 1610-7438
Library of Congress Control Number: 2011934157 c
2011 Springer-Verlag Berlin Heidelberg
This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer. Violations are liable for prosecution under the German Copyright Law. The use of general descriptive names, registered names, trademarks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. Typeset & Cover Design: Scientific Publishing Services Pvt. Ltd., Chennai, India. Printed on acid-free paper 543210 springer.com
Editorial Advisory Board
EUR ON
Oliver Brock, TU Berlin, Germany Herman Bruyninckx, KU Leuven, Belgium Raja Chatila, LAAS, France Henrik Christensen, Georgia Tech, USA Peter Corke, Queensland Univ. Technology, Australia Paolo Dario, Scuola S. Anna Pisa, Italy Rüdiger Dillmann, Univ. Karlsruhe, Germany Ken Goldberg, UC Berkeley, USA John Hollerbach, Univ. Utah, USA Makoto Kaneko, Osaka Univ., Japan Lydia Kavraki, Rice Univ., USA Vijay Kumar, Univ. Pennsylvania, USA Sukhan Lee, Sungkyunkwan Univ., Korea Frank Par
Data Loading...