Breakdown Experiments
In this section a set of dynamic applied field experiments are presented. We designed these experiments to study intrinsic and metal-catalyzed failure. Techniques such as ramped voltage sweeps and bipolar applied field tests are utilized to characterize f
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Juan Pablo Borja Toh-Ming Lu Joel Plawsky
Dielectric Breakdown in Gigascale Electronics Time Dependent Failure Mechanisms 123
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Juan Pablo Borja • Toh-Ming Lu • Joel Plawsky
Dielectric Breakdown in Gigascale Electronics Time Dependent Failure Mechanisms
Juan Pablo Borja General Electric Global Research Center Niskayuna, NY, USA Joel Plawsky Chemical and Biological Engineering Rensselaer Polytechnic Institute Troy, NY, USA
Toh-Ming Lu Department of Physics, Applied Physics, & Astronomy Rensselaer Polytechnic Institute Troy, NY, USA
ISSN 2192-1091 ISSN 2192-1105 (electronic) SpringerBriefs in Materials ISBN 978-3-319-43218-2 ISBN 978-3-319-43220-5 (eBook) DOI 10.1007/978-3-319-43220-5 Library of Congress Control Number: 2016947956 © The Author(s) 2016 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, expres
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