Data Modeling for Metrology and Testing in Measurement Science
This book and companion DVD provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods described in standard texts. The emphasis throughout is on techniques having a broad range of real-worl
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H.G. Othmer (Mathematical Biology) Department of Mathematics University of Minnesota 270A Vincent Hall Minneapolis, MN 55455, USA [email protected]
K.J. Bathe (Solid Mechanics) Department of Mechanical Engineering Massachusetts Institute of Technology Cambridge, MA 02139, USA [email protected]
L. Preziosi (Industrial Mathematics) Dipartimento di Matematica Politecnico di Torino Corso Duca degli Abruzzi 24 10129 Torino, Italy [email protected]
P. Degond (Semiconductor and Transport Modeling) Mathmatiques pour l’Industrie et la Physique Universit P. Sabatier Toulouse 3 118 Route de Narbonne 31062 Toulouse Cedex, France [email protected] A. Deutsch (Complex Systems in the Life Sciences) Center for Information Services and High Performance Computing Technische Universitt Dresden 01062 Dresden, Germany [email protected] M.A. Herrero Garcia (Mathematical Methods) Departamento de Matematica Aplicada Universidad Complutense de Madrid Avenida Complutense s/n 28040 Madrid, Spain [email protected] W. Kliemann (Stochastic Modeling) Department of Mathematics Iowa State University 400 Carver Hall Ames, IA 50011, USA [email protected]
V. Protopopescu (Competitive Systems, Epidemiology) CSMD Oak Ridge National Laboratory Oak Ridge, TN 37831-6363, USA [email protected] K.R. Rajagopal (Multiphase Flows) Department of Mechanical Engineering Texas A&M University College Station, TX 77843, USA [email protected] Y. Sone (Fluid Dynamics in Engineering Sciences) Professor Emeritus Kyoto University 230-133 Iwakura-Nagatani-cho Sakyo-ku Kyoto 606-0026, Japan [email protected]
Data Modeling for Metrology and Testing in Measurement Science
Franco Pavese Alistair B. Forbes Editors
Birkhäuser Boston • Basel • Berlin
Franco Pavese Istituto Nazionale di Ricerca Metrologica, Torino, Italy [email protected] [email protected]
ISBN 978-0-8176-4592-2 DOI 10.1007/978-0-8176-4804-6
Alistair B. Forbes National Physics Laboratory, Middlesex, UK [email protected]
e-ISBN 978-0-8176-4804-6
Library of Congress Control Number: 2008938171 Mathematics Subject Classification (2000): 60–80, 60K10, 60K40, 60K99, 62-XX, 65C50. © Birkhäuser Boston, a part of Springer Science+Business Media, LLC 2009 All rights reserved. This work may not be translated or copied in whole or in part without the written permission of the publisher (Birkhäuser Boston, c/o Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden. The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights. Printed on acid-free paper. www.birkhauser.com
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