Depth of Origin of Secondary Ions: Suppression and Enhancement of Ions Upon Passage Through Overlayers.

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DEPTH OF ORIGIN OF SECONDARY IONS: SUPPRESSION AND ENHANCEMENT OF IONS UPON PASSAGE THROUGH OVERLAYERS. N. J. SACK, M. AKBULUT, AND T. E. MADEY Rutgers, The State University of New Jersey, Department of Physics and Astronomy and Laboratory for Surface Modification, Piscataway, NJ 08855. ABSTRACT We are investigating the transmission of low energy ions (

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