Ellipsometry of Functional Organic Surfaces and Films
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsome
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Karsten Hinrichs Klaus-Jochen Eichhorn Editors
Ellipsometry of Functional Organic Surfaces and Films
Springer Series in Surface Sciences Volume 52
Editors: G. Ertl, H. Lüth and D.L. Mills
For further volumes: http://www.springer.com/series/409
Springer Series in Surface Sciences This series covers the whole spectrum of surface sciences, including structure and dynamics of clean and adsorbate-covered surfaces, thin films, basic surface effects, analytical methods and also the physics and chemistry of interfaces. Written by leading researchers in the field, the books are intended primarily for researchers in academia and industry and for graduate students.
Karsten Hinrichs r Klaus-Jochen Eichhorn Editors
Ellipsometry of Functional Organic Surfaces and Films
Editors Karsten Hinrichs Leibniz-Institut für Analytische Wissenschaften – ISAS – e.V. Berlin, Germany
Klaus-Jochen Eichhorn Leibniz-Institut für Polymerforschung Dresden e.V. Dresden, Germany
Series Editors Gerhard Ertl Fritz-Haber-Institute der Max-Planck-Gesellschaft Berlin, Germany
Douglas L. Mills Department of Physics University of California, Irvine Irvine, CA, USA
Hans Lüth Institut für Schicht- und Ionentechnik Forschungszentrum Jülich GmbH Jülich, Germany
ISSN 0931-5195 Springer Series in Surface Sciences ISBN 978-3-642-40127-5 ISBN 978-3-642-40128-2 (eBook) DOI 10.1007/978-3-642-40128-2 Springer Heidelberg New York Dordrecht London Library of Congress Control Number: 2013952462 © Springer-Verlag Berlin Heidelberg 2014 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. Exempted from this legal reservation are brief excerpts in connection with reviews or scholarly analysis or material supplied specifically for the purpose of being entered and executed on a computer system, for exclusive use by the purchaser of the work. Duplication of this publication or parts thereof is permitted only under the provisions of the Copyright Law of the Publisher’s location, in its current version, and permission for use must always be obtained from Springer. Permissions for use may be obtained through RightsLink at the Copyright Clearance Center. Violations are liable to prosecution under the respective Copyright Law. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. While the advice and information in this book are believed to be true and accurate at the date of publication, neither the authors nor the editors nor the publis
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