Enhancement and Recovery in Atomic Force Microscopy Images

Atomic force microscopy (AFM) images have become increasingly useful in the study of biological, chemical, and physical processes at the atomic level. The acquisition of AFM images takes more time than the acquisition of most optical images, so that the a

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Editorial Advisory Board Akram Aldroubi Vanderbilt University Nashville, TN, USA

Jelena Kovaˇcevi´c Carnegie Mellon University Pittsburgh, PA, USA

Andrea Bertozzi University of California Los Angeles, CA, USA

Gitta Kutyniok Technische Universit¨at Berlin Berlin, Germany

Douglas Cochran Arizona State University Phoenix, AZ, USA

Mauro Maggioni Duke University Durham, NC, USA

Hans G. Feichtinger University of Vienna Vienna, Austria

Zuowei Shen National University of Singapore Singapore, Singapore

Christopher Heil Georgia Institute of Technology Atlanta, GA, USA

Thomas Strohmer University of California Davis, CA, USA

St´ephane Jaffard University of Paris XII Paris, France

Yang Wang Michigan State University East Lansing, MI, USA

For further volumes: http://www.springer.com/series/4968

Travis D. Andrews • Radu Balan John J. Benedetto • Wojciech Czaja Kasso A. Okoudjou Editors

Excursions in Harmonic Analysis, Volume 2 The February Fourier Talks at the Norbert Wiener Center

Editors Travis D. Andrews Norbert Wiener Center Department of Mathematics University of Maryland College Park, MD, USA

Radu Balan Norbert Wiener Center Department of Mathematics University of Maryland College Park, MD, USA

John J. Benedetto Norbert Wiener Center Department of Mathematics University of Maryland College Park, MD, USA

Wojciech Czaja Norbert Wiener Center Department of Mathematics University of Maryland College Park, MD, USA

Kasso A. Okoudjou Norbert Wiener Center Department of Mathematics University of Maryland College Park, MD, USA

ISBN 978-0-8176-8378-8 ISBN 978-0-8176-8379-5 (eBook) DOI 10.1007/978-0-8176-8379-5 Springer New York Heidelberg Dordrecht London Library of Congress Control Number: 2012951313 Mathematics Subject Classification (2010): 26-XX, 35-XX, 40-XX, 41-XX, 42-XX, 43-XX, 44-XX, 46-XX, 47-XX, 58-XX, 60-XX, 62-XX, 65-XX, 68-XX, 78-XX, 92-XX, 93-XX, 94-XX © Springer Science+Business Media New York 2013 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. Exempted from this legal reservation are brief excerpts in connection with reviews or scholarly analysis or material supplied specifically for the purpose of being entered and executed on a computer system, for exclusive use by the purchaser of the work. Duplication of this publication or parts thereof is permitted only under the provisions of the Copyright Law of the Publisher’s location, in its current version, and permission for use must always be obtained from Springer. Permissions for use may be obtained through RightsLink at the Copyright Clearance Center. Violations are liable to prosecution under the respective Copyright Law. The use of gene