Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunne
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope
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Bert Voigtländer
Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy
NanoScience and Technology Series editors Phaedon Avouris, Yorktown Heights, USA Bharat Bhushan, Columbus, USA Dieter Bimberg, Berlin, Germany Hiroyuki Sakaki, Tokyo, Japan Klaus von Klitzing, Stuttgart, Germany Roland Wiesendanger, Hamburg, Germany
The series NanoScience and Technology is focused on the fascinating nano-world, mesoscopic physics, analysis with atomic resolution, nano and quantum-effect devices, nanomechanics and atomic-scale processes. All the basic aspects and technology-oriented developments in this emerging discipline are covered by comprehensive and timely books. The series constitutes a survey of the relevant special topics, which are presented by leading experts in the field. These books will appeal to researchers, engineers, and advanced students.
More information about this series at http://www.springer.com/series/3705
Bert Voigtländer
Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy
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Bert Voigtländer Forschungszentrum Jülich Peter Grünberg Institut (PGI-3) Jülich Germany and RWTH Aachen Lehrstuhl für Experimentalphysik IV A Aachen Germany
ISSN 1434-4904 NanoScience and Technology ISBN 978-3-662-45239-4 DOI 10.1007/978-3-662-45240-0
ISSN 2197-7127 (electronic) ISBN 978-3-662-45240-0
(eBook)
Library of Congress Control Number: 2014958892 Springer Heidelberg New York Dordrecht London © Springer-Verlag Berlin Heidelberg 2015 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made. Printed on acid-free paper Springer-Verlag GmbH Berlin Heidelberg is part of Springer Science+Business Media (www.springer.com)
For Ortraud
Preface
The aim of this textbook is to introduce scanning probe microscopy to graduate students and others wishing to learn about the subject from fundamental principles. The original literature is fascinating but hard going; I had a hard time trying to understand it myself. Therefore this
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