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1210-Q05-08

Evaluating Amorphization Around Micro-Cracks in PV Silicon Prashant K. Kulshreshtha, Khaled M. Youssef and George Rozgonyi Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27606-7907, USA

ABSTRACT Since the initiation and propagation of a micro-crack in a silicon wafer introduces local variations in stress, it is critical to the understanding of wafer breakage that accurate profiling of stress be performed in the vicinity of the micro-crack. In this study, nanoindentation has been used to investigate the stress-relaxation during crack initiation and propagation in material of particular interest to the photovoltaic (PV) industry. The low load (

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