Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring Systems
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Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring Systems Q. Huang 1 & J. Jiang 1
&
Y. Q. Deng 1
Received: 10 March 2020 / Accepted: 16 June 2020 # Springer Science+Business Media, LLC, part of Springer Nature 2020
Abstract To increase the reliability of wireless-based monitoring systems under ionizing radiation environments, multiple diversified commercial off-the-shelf (COTS) modules have been used to achieve radiation tolerance. This paper presents experimental results of radiation tests on key modules in wireless-based monitoring systems, which include analog signal processing circuits, analog-to-digital converter (ADC) modules, microcontroller modules, and wireless transmission modules. In total, 12 modules have been evaluated, (i.e. 3 analog modules, 3 ADCs, 3 microcontrollers, and 3 wireless transmission modules). The radiation tests are conducted using the gamma radiator at The Ohio State University Nuclear Reactor Lab (OSU-NRL). The performance parameters of these 12 modules are investigated under high dose rate (20 krad(Si)/h). Experimental results have shown that the tested modules perform satisfactorily with little sign of degradation until the total dose levels reach the tolerable limits for these modules. Experimental results support the fact that, by using diversified COTS components, one may be able to achieve equivalent performance as those built by using radiation-hardened components, but with a considerable cost-saving. Furthermore, the tests also show that digital modules, particularly, with higher speed processors (i.e. microcontrollers) may be more susceptible to radiation than other types of modules. Therefore, additional shielding should be used to protect them. Keywords Total dose test . Radiation assessment . Diversified hardware . Radiation-hardened . COTS
1 Introduction Wireless monitoring systems are widely used to gather information in high level radiation environments, such as aeronautics and deep space exploration, nuclear warfare, and nuclear power plants in the event of an accident. One critical issue is to understand the effects of radiation on these monitoring systems. Such knowledge will be valuable during system component selection, circuit design and protection. One of the best ways to gain such knowledge is to subject physical components and modules to strong radiation tests, and evaluate their Responsible Editor: S. Mir * J. Jiang [email protected] Q. Huang [email protected] Y. Q. Deng [email protected] 1
Department of Electrical & Computer Engineering, The University of Western Ontario, London, Ontario N6A 5B9, Canada
performance degradation profile under various operating conditions. Over the years, many research studies have been performed to obtain radiation data. In general, the objective of a radiation test can be separated to three distinct types: (1) to investigate the mechanisms of the interaction of radiation particles with semiconductor materials and to understand how radiation induces failures in electronic devices mad
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