Radiation Effects on Embedded Systems
Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high al
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Radiation Effects on Embedded Systems
edited by
RAOUL VELAZCO TIMA Laboratory, Grenoble, France
PASCAL FOUILLAT Université Bordeaux 1, France and
RICARDO REIS Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
A C.I.P. Catalogue record for this book is available from the Library of Congress.
ISBN-10 ISBN-13 ISBN-10 ISBN-13
1-4020-5645-1 (HB) 978-1-4020-5645-1 (HB) 1-4020-5646-X (e-book) 978-1-4020-5646-8 (e-book)
Published by Springer, P.O. Box 17, 3300 AA Dordrecht, The Netherlands. www.springer.com
Printed on acid-free paper
All Rights Reserved © 2007 Springer No part of this work may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, microfilming, recording or otherwise, without written permission from the Publisher, with the exception of any material supplied specifically for the purpose of being entered and executed on a computer system, for exclusive use by the purchaser of the work.
CONTENTS
Preface
vii
Radiation Space Environment J.-C. Boudenot (THALES)
1
Radiation Effects in Microelectronics R.D. Schrimpf (Vanderbilt University)
11
In-flight Anomalies on Electronic Devices R. Ecoffet (CNES)
31
Multi-Level Fault Effects Evaluation L. Anghel (TIMA), M. Rebaudengo, M. Sonza Reorda, M. Violante (POLI Torino)
69
Effects of Radiation on Analog and Mixed-Signal Circuits M. Lubaszewski, T. Balen, E. Schuler, L. Carro (UFRGS), J.L. Huertas (IMSE-CNM)
89
Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing P. Fouillat, V. Pouget (IXL), D. McMorrow (NRL). F. Darracq (IXL), S. Buchner (QSS), D. Lewis (IXL)
121
Design Hardening Methodologies for ASICs F. Faccio (CERN)
143
Fault Tolerance in Programmable Circuits F.L. Kastensmidt (UFRGS), R. Reis (UFRGS)
161
Automatic Tools for Design Hardening C. López-Ongill, L. Entrena, M. García-Valderas, M. Portela-García (Univ. Carlos III)
183
v
vi Test Facilities for SEE and Dose Testing S. Duzellier (ONERA), G. Berger (UCL) Error Rate Prediction of Digital Architectures: Test Methodology and Tools R. Velazco, F. Faure (TIMA) Using the SEEM Software for Laser SET Testing and Analysis V. Pouget, P. Fouillat, D. Lewis (IXL)
Contents 201
233
259
PREFACE Since the loss of Telestar satellite in 1962, as a consequence of a high altitude nuclear test, it is known that natural or man-made radiation may perturb the operation of electronic equipments. Today, space vehicles highly rely on electronics and consequently space radiation effects must be considered at the design phase to guarantee the high-reliability and safety requirements of such projects. Even if spacequalified devices exist, so-called “hardened” with respect to radiation effects at the design and/or the manufacturing level, their high cost and lower performances compared with equivalent commercially available devices (Commercial Off The Shelf, COTS) make mass production components, not designed on purpose for space use, quasi mandatory for space applications. This constitutes
