Experimental Technique

In Sect. 3.1, a number of thermography and lock-in thermography approaches from literature are described and discussed, both steady-state and non-steady-state, showing the large variety of thermography measurement possibilities. Many of these systems are

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ADVANCED MICROELECTRONICS

10

Springer-Verlag Berlin Heidelberg GmbH

Physics and Astronomy

ONLINE LIBRARY

http://www.springer.de/phys/

Springer Series in

ADVANCED MICROELECTRONICS Series Editors: K. Itoh T. Lee T. Sakurai W. M. C. Sansen

D. Schmitt-Landsiedel

The Springer Series in Advanced Microelectronics provides systematic information on all the topics relevant for the design, processing, and manufacturing of microelectronic devices. The books, each prepared by leading researchers or engineers in their fields, cover the basic and advanced aspects of topics such as wafer processing, materials, device design, device technologies, circuit design, VLSI implementation, and subsystem technology. The series forms a bridge between physics and engineering and the volumes will appeal to practicing engineers as well as research scientists. 1

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Cellular Neural Networks Chaos, Complexity and VLSI Processing By G. Manganaro, P. Arena, and L. Fortuna Technology of Integrated Circuits By D. Widmann, H. Mader, and H. Friedrich Ferroelectric Memories By J.F. Scott Microwave Resonators and Filters for Wireless Communication Theory, Design and Application By M. Makimoto and S. Yamashita VLSI Memory Chip Design ByK. Itoh Smart Power ICs Technologies and Applications Ed. by B. Murari, R. Bertotti, and G.A. Vignola Noise in Semiconductor Devices Modeling and Simulation By F. Bonani and G. Ghione

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Logic Synthesis for Asynchronous Controllers and Interfaces By J. Cortadella, M. Kishinevsky, A. Kondratyev, L. Lavagno, and A. Yakovlev Low Dielectric Constant Materials for IC Applications Editors: P.S. Ho, J. Leu, W.W. Lee Lock-in Thermography Basics and Use for Functional Diagnostics of Electronic Components By 0. Breitenstein and M. Langenkamp High-Frequency Bipolar Transistors Physics, Modelling, Applications ByM. Reisch Current Sense Amplifiers for Embedded SRAM in High-Performance System-on-a-Chip Designs By B. Wicht Reversible Logic Synthesis From Fundamentals to Quantum Computing By A.N. Al-Rabadi

Series homepage - http://www.springer.de/phys/books/ssam/

0. Breitenstein

M. Langenkamp

lock-in Thermography Basics and Use for Functional Diagnostics of Electronic Components

With 61 Figures Including 24 Color Figures

~ Springer

Dr. Otwin Breitenstein Dr. Martin Langenkamp* Max-Planck-Institut fUr Mikrostrukturphysik Weinberg2 06120 Halle, Germany

* Present Address: Peter Wolters Surface Technologies GmbH & Co. KG Busumer Strasse 96 24768 Rendsburg, Germany

Series Editors: Dr. Kiyoo Itoh

Professor Willy M. C. Sansen

Hitachi Ltd., Central Research Laboratory 1-280 Higashi-Koigakubo Kokubunji-shi, Tokyo 185-8601, Japan

Katholieke Universiteit Leuven, ESAT-MICAS Kasteelpark Arenberg 10 3001 Leuven, Belgium

Professor Thomas Lee

Professor Doris Schmitt-Landsiedel

Stanford University Department of Electrical Engineering 420 Via Palou Mall, CIS-205 Stanford, CA 94305-4070, USA

Technische Universitiit Miinchen Lehrstuhl rur Technische Elektronik Theresienstra,sse 90, Gebiiude N3 8