Image Correlation for Shape, Motion and Deformation Measurements Bas
Image Correlation for Shape, Motion and Deformation Measurements provides a comprehensive overview of data extraction through image analysis. Readers will find and in-depth look into various single- and multi-camera models (2D-DIC and 3D-DIC), two- and th
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Michael A. Sutton • Jean-José Orteu Hubert W. Schreier
Image Correlation for Shape, Motion and Deformation Measurements Basic Concepts, Theory and Applications
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Michael A. Sutton University of South Carolina Department of Mechanical Engineering Columbia, SC 29208 USA [email protected]
Jean-José Orteu Ecole des Mines d’Albi Campus Jarlard Albi 81013 France [email protected]
Hubert W. Schreier Correlated Solutions, Inc. 120 Kaminer Way Parkway Suite A Columbia, SC 29210 USA [email protected]
ISBN: 978-0-387-78746-6 e-ISBN: 978-0-387-78747-3 DOI: 10.1007/978-0-387-78747-3 Library of Congress Control Number: 2008938227 c Springer Science+Business Media, LLC 2009 ° All rights reserved. This work may not be translated or copied in whole or in part without the written permission of the publisher (Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden. The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights. Printed on acid-free paper springer.com
To Shameka, Isabel and Fiona Schreier; Elizabeth Ann Sutton, Michelle MK Sutton Spigner and Elizabeth Sutton; Catherine, Benoˆıt and Julie Orteu, the authors wish to express their gratitude to all family members for having persevered through the 19 months of effort necessary to complete this manuscript. Finally, to our parents, through the publication of this book we hope to thank them and honor them for all their support over the years, including those that are no longer with us; Frances Rosalie Kaffenberger Sutton (1916–2002) and Percy Albert Sutton (1902–1979). Financial support for the research described in this book was provided by a number of sources. We gratefully acknowledge the National Science Foundation, NASA Langley and NASA Headquarters, Army Research Office, Air Force Office of Scientific Research, Wright Patterson Air Force Research Lab, General Motors, Sonoco Products, University of Maryland, Sandia National Laboratory, University of South Carolina and Ecole des Mines d’Albi. Access to the facilities of the
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Cornell Nanofabrication Facility and Center for Electron Microscopy at the University of South Carolina is also gratefully acknowledged. Michael A. Sutton University of South Carolina Jean-José Orteu Ecole des Mines d’Albi Hubert W. Schreier Correlated Solutions, Incorporated
Preface
The impetus for the enclosed book is the nexus of accelerating interest and use of computer-vision-based measurement methods and the accumulation of sufficient theoretical, computational and experimental findings for development of a comprehensive treatment of t
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