Introduction: Soft Error Modeling
Reliability of the VLSI circuits has become an important issue in the current years. Among these noise sources, radiation-induced soft errors in commercial nanometer CMOS technologies have become a growing concern. This chapter provides introductions to s
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Soft Error Reliability of VLSI Circuits
Analysis and Mitigation Techniques
Soft Error Reliability of VLSI Circuits
Behnam Ghavami • Mohsen Raji
Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques
Behnam Ghavami Shahid Bahonar University of Kerman Kerman, Iran
Mohsen Raji Shiraz University Shiraz, Iran
ISBN 978-3-030-51609-3 ISBN 978-3-030-51610-9 (eBook) https://doi.org/10.1007/978-3-030-51610-9 © Springer Nature Switzerland AG 2021 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors, and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, expressed or implied, with respect to the material contained herein or for any errors or omissions that may have been made. The publisher remains neutral with regard to jurisdictional claims in published maps and institutional affiliations. This Springer imprint is published by the registered company Springer Nature Switzerland AG The registered company address is: Gewerbestrasse 11, 6330 Cham, Switzerland
“I want to thank my father and mother.” Thank you. Dedicated to my family, Arezoo and Hiva. Behnam “I want to thank my father and mother.” Thank you. Dedicated to my family, Zahra and Aala. Mohsen
Preface
In recent decades, VLSI circuit designers have achieved high-speed circuits with fewer power requirements by continuously reducing the transistor dimensions. Besides these benefits, the digital circuits have become more sensitive against environmental faults due to several factors such as decreasing the transistor size and the supply voltage. Hence, the reliability of the VLSI circuits has become an important issue in recent years. Among these noise sources, radiation-induced soft errors in commercial nanometer CMOS technologies have become a growing concern. Nanometer integrated circuits are getting increasingly vulnerable to soft errors making the soft error rate (SER) estimation and optimization an important challenge. Efficient and accurate SER estimation and optimization of the large-scale combinational circuits help the designers to achieve more reliable integrated circuits. This book will investigate emerging trends in the design of today’s reliable electronic systems w
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