Soft Error Mechanisms, Modeling and Mitigation
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for co
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Soft Error Mechanisms, Modeling and Mitigation
Soft Error Mechanisms, Modeling and Mitigation
Selahattin Sayil
Soft Error Mechanisms, Modeling and Mitigation
123
Selahattin Sayil Lamar University Beaumont, TX USA
ISBN 978-3-319-30606-3 DOI 10.1007/978-3-319-30607-0
ISBN 978-3-319-30607-0
(eBook)
Library of Congress Control Number: 2016932747 © Springer International Publishing Switzerland 2016 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made. Printed on acid-free paper This Springer imprint is published by Springer Nature The registered company is Springer International Publishing AG Switzerland
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Preface
With advances in CMOS technology, nanometer circuits are increasingly becoming more sensitive to soft errors caused by single event particles. Most textbook published in the area considered single event transients (SET) as the main cause of radiation-induced transient failure of combinatorial circuits. This book provides the reader with new knowledge on various radiation soft error mechanisms that are not mentioned in similar textbooks. These mechanisms include soft delays, radiation-induced clock jitter and pulses, and single event (SE) coupling noise and delay effects. The text discusses various hardening techniques for combinational logic, and describes two mitigation techniques in detail: “dynamic threshold technique” and “transmission gate technique with varied gate and body bias.” Hardening techniques developed for combinational logic have long ignored interconnect coupling effects. Hence, various mitigation strategies to eliminate SE coupling effects are also discussed. As technologies advance, the coupling effects increasingly cause SE transients to contaminate electronically unrelated circuit paths which can in turn increase the “Single Event Susceptibility” of CMOS circuits. In order to complement the soft error hardening process, coupling effects among interconnects need to be considered in the single event hardening and analys
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