Journal of Materials Research
- PDF / 107,384 Bytes
- 1 Pages / 604.8 x 806.4 pts Page_size
- 101 Downloads / 232 Views
Journal of Materials Research Articles in the June 1991 Issue (Vol. 6, No. 6) A New Approach to Fracture Toughness Analysis and its Application to ABS Polymers, by B.Y. Ni, T-Y. Zhang, and J.C.M Li. Accumulation of Structural Defects in Ion-Irradiated Ca2Nd8(Si0 4 ) 6 0 2 , by W.J. Weber, R.K. Eby, and R.C. Ewing. Alkali Emission Accompanying Fracture of Sodium Silicate Glasses, by S.C. Langford, L.C. Jensen, J.T. Dickinson, and L.R. Pederson. Bandfilling and Structural Stability of Trialuminides: YA13, ZrAl3, and NbAl3, by J. Xu and A.J. Freeman. Characterization of Electrochemical Photovoltaic Cells Using Polycrystalline CdSe and CdTe Electrodes Grown by a Liquid Metal-Vapor Reaction, by Z. Deng, M. Cinquino, and M.F. Lawrence. Characterization of Interface States in (S^CaJTiO^ Based Ceramics by ICTS Analysis, by Y. Nakano. Chemical Reactions of Lead Magnésium Niobate Tîtanate in Présence of a Glass, by V. Srikanth and E.C. Subbarao. Fractal Fracture of Single Crystal Silicon, by Y.L. Tsai and J.J. Mecholsky Jr. H O Catalysis of Aluminum Carbide Formation in the Aluminum-Silicon Carbide System, by B. Maruyama and F.S. Ohuchi. Hydride Structures in Ti-Aluminides Subjected to High Température and Hydrogen Pressure Charging Conditions, by D. Legzdina, I.M. Robertson, and H.K. Birnbaum. Identification of Tetragonal and Cubic Structures of Zirconia Using Synchrotron X-Radiation Source, by R. Srinivasan, R.J. De Angelis, G. Ice, S.F. Simpson, J.M. Harris, andB.H. Davis. Ion Beam Mixing of U Based Bilayers, by F. Rossi, M. Nastasi, J.R. Tesmer, M. Cohen, C. Egert, and C. Olsen. Lattice Location and Hardness of Ta-Implanted NijAl, by G.S. Was, S. Mantl, and W. Oliver. Local Magnetic Field Distribution in Polycrystalline YBa2Cu 3 0 7 and its Influence on Bulk Critical Currents, by T.R. Askew, R.B. Flippen, K.J. Leary, and M.N. Kunchur. Mechanical Properties of Single-Quasicrystalline AlCuCoSi, by R. Wittmann, K. Urban, M. Schandl, and E. Hornbogen.
Near-Interface Characterization of Diamond Films on Silica and Silicon, by D. Pickrell, W. Zhu, A. Badzian, R. Newnham, and R. Messier. New Evidence for a Pressure-Induced Phase Transformation during the Indentation of Silicon, by G.M. Pharr, W.C. Oliver, and D.S. Harding. On a New Example of Ramified Electrodeposits, by V. Fleury. On the Elastic Behavior of Composition-Modulated Superlattices, by J. A. Jaszczak and D. Wolf. Post Déposition Excimer Laser Processing of MoSx Thin Films, by T.R. Jervis, J-P. Hirvonen, and M. Nastasi. Predicting Quasicrystals with Quantum Structural Diagrams, by J. Tartas and E.J. Knystautas. Préparation of the 110K Single Phase Superconductor Bi1 Pba4Ca2Sr2Cu3Ox Using a Precursor Matrix Reaction Method, by Z. Wang, B.W. Statt, M.J.G. Lee, S. Bagheri, and J. Rutter. Sélective and Low Température Synthesis of Polycrystalline Diamond, by R. Ramesham, T. Roppel, C. Ellis, D.A. Jaworske, and W. Baugh. Solvent-Induced Damage in Polyimide Thin Films, by M.S. Hu, M.Y. He, and A.G. Evans. Structural Study of Amorphous W 0 3 Thin Films Prepared by Ion Exch
Data Loading...
