Morphology of Amerphous Alloy Formed by Ion Beam Bombardment
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morphology of Amerphous Alloy Formed By Ion Beam Bombardment Tian Wei, Cai Wei Ping, Li Jun, Wu Run Wuhan Iron and Steel University, Wuhan, Hubei, China Abstract A study vras nerfo'-ned to in'restigete the morpholog.! of amromhous eQ b- meeris of ion bean bombardment. The snecime.ns of Fe deposited with Cr, Ti, Cr-Ni or Cr-Ni-Cr mu]tilayers were banbarded by high doses of Ar+, N+ or Ti' ion beaws respetively. "EM and ele•tron diffrection analysis were then used to study the kinetic tr;mnsfarmation of amermhous to crystal during heating. The electro-chenical reqults hlvn showed after that the anodic current density Ic aid Tm were reduced remarkably.
all.oys which were fmom-i nn the surf Pce of the q
Int-oduction In the 60's, in the fiel.d of rn-teriai research , wide attention was uaid to Klement, W.Jlens and Duwez 's research (1) showing that Au-Si amor"-hous al.loy can be made by quenching it in liquified nitrogen. Since then, outstanding nroqress has been made in the research of making amorphous alloy, as well as the study of its structure and properties (2-3). Recently developed techniques of ion inplantation are used not only in the mordification of surface element content,structure and properties includinq hardness and resistance to wear, friction, oxidation at hig. temeerp'lre and aqu)ous corrosion(4-7), but also in making surface a].)ovs of different struct-ures(8-9). In this paper, we deal. with the formnflon of amornhous alloys in which the nure iron samples are deposi-ed with Cr or Ti of various thicknesses, Cr-Ni duolex film or Cr-Ni-Cr multilayers
hn1barded by hiqh doses of Art+, N+ or Ti+ ion bears under different conditionst. Bty means of elecrtron diffraction analysis, inmmstigations were ,made .into the am~rphous morohol._y, and tke transformation of amorphous alloys to crystals during heating. Also measurements ,vere made of the 'nacro-copic electro chemici'J nroperties. Exreriments 1. Preparation 0.' specinmens for electrchemical anal.vsis The specimens of nolvr sta3. nure i.ron( 10/0mn) contasining 0.014%c, 0.012%Si, 0.26%Mn, 0.007%6, 0.004%s, 0.001%V. and Fe -ere polished metallographically and finally, using lp diamond paste, finished down to the sm.octhness of a mirror. After cleaning and drying, they were put into e vaccum ,ranrratlor, in vwhch the specimenq were denosited with r=, Ti, Cr-Fi or Cr-Ni-Cr rew-ectivelv. The vacuity drring denosited was l-2410 torr, and the thicfrnesses of the fi]ims were evatnated with a microhalance w.ose error was u.der 10'sg. 2. T&M e-,--.-.dna-in.n TE4 specimers ( 390.1mn) were urpared as mentioned above. Before deposited: the final treatment of the specimens was the reduction of the thickness by Jet electrovolishing using 10% vrechioric acid-alcohol solution. After depositing,this same method was u~sed again on the back side of the specimens in order to further reduce the thickne'ls.
Mat. Res. Soc. Symp. Proc. Vol. 128. t1989 Materials Research Society
238
The transimissionelectron microscope, JEM 100CX-IT, was used to exemine the morphology, local e
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