Noncontact Atomic Force Microscopy Volume 2
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with at
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NanoScience and Technology Series Editors: P. Avouris B. Bhushan D. Bimberg K. von Klitzing H. Sakaki R. Wiesendanger The series NanoScience and Technology is focused on the fascinating nano-world, mesoscopic physics, analysis with atomic resolution, nano and quantum-effect devices, nanomechanics and atomic-scale processes. All the basic aspects and technology-oriented developments in this emerging discipline are covered by comprehensive and timely books. The series constitutes a survey of the relevant special topics, which are presented by leading experts in the f ield. These books will appeal to researchers, engineers, and advanced students.
Please view available titles in NanoScience and Technology on series homepage http://www.springer.com/series/3705/
Seizo Morita Franz J. Giessibl Roland Wiesendanger Editor
Noncontact Atomic Force Microscopy Volume 2
With 196 Figures
123
Professor Dr. Seizo Morita
Professor Dr. Roland Wiesendanger
Osaka University Graduate School of Engineering Department of Electrical, Electronic and Information Engineering Yamada-Oka 2-1, Suita 565-0871, Japan E-mail: [email protected]
Institut f¨ur Angewandte Physik Universit¨at Hamburg Jungiusstr. 11, 20355 Hamburg, Germany E-mail: rwiesendanger @physnet.uni-hamburg.de
Professor Dr. Franz J. Giessibl Universit¨at Regensburg, Institut f¨ur Experimentelle und Angewandte Physik Universit¨atsstr. 31, 93053 Regesnburg, Germany E-mail: [email protected]
Series Editors: Professor Dr. Phaedon Avouris
Professor Dr., Dres. h.c. Klaus von Klitzing
IBM Research Division Nanometer Scale Science & Technology Thomas J. Watson Research Center P.O. Box 218 Yorktown Heights, NY 10598, USA
Max-Planck-Institut f¨ur Festk¨orperforschung Heisenbergstr. 1 70569 Stuttgart, Germany
Professor Dr. Bharat Bhushan
University of Tokyo Institute of Industrial Science 4-6-1 Komaba, Meguro-ku Tokyo 153-8505, Japan
Ohio State University Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) Suite 255, Ackerman Road 650 Columbus, Ohio 43210, USA
Professor Dr. Dieter Bimberg TU Berlin, Fakut¨at Mathematik/ Naturwissenschaften Institut f¨ur Festk¨orperphyisk Hardenbergstr. 36 10623 Berlin, Germany
Professor Hiroyuki Sakaki
Professor Dr. Roland Wiesendanger Institut f¨ur Angewandte Physik Universit¨at Hamburg Jungiusstr. 11 20355 Hamburg, Germany
NanoScience and Technology ISSN 1434-4904 ISBN 978-3-642-01494-9 e-ISBN 978-3-642-01495-6 DOI 10.1007/978-3-642-01495-6 Library of Congress Control Number: 2009930388 © Springer-Verlag Berlin Heidelberg 2009 This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specif ically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microf ilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and pe
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