Product News
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Product News
Ó ASM International 2013
Atomic Force Microscope Provides High-Accuracy Noncontact Imaging
Park Systems Inc. introduces the NX20, a large-sample atomic force microscope (AFM) for failure analysis and quality assurance laboratories in the hard disk drive and semiconductor industries. True noncontact mode technology delivers noncontact AFM imaging without compromising measurement accuracy or user productivity. It also reduces tip replacement costs by extending tip lifetime up to ten times that of other tips.
The advantages of the NX20 for FA and QA highlight Park’s True Non-Contact Mode, where the probe tip reliably remains above the surface of the sample due to the decoupled Z-dimension positioning servo. The NX20 also features True Sample Topography, Park’s unique technology for measuring the Z-position with a low-noise Z detector. This feature removes the effects of edge overshoot or piezo creep. The NX20 provides extremely accurate surface roughness measurements for media and substrates, defect review imaging and analysis, high-resolution electrical scan mode, and with decoupled XY scanning, sidewall measurements for 3D structure study. For more information: Park Systems Inc., 3040 Olcott St., Santa Clara, CA 95054; tel: 408/986-1110; fax: 408/986-1199; e-mail: [email protected]; web: www. parkafm.com/nx.
Laser Scanning Microscope Combines Features of Optical Microscope, Roughness Gage, SEM
NX20 large-sample atomic force microscope (AFM) by Park Systems Inc.
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Keyence has developed the VK-X Series 3D Laser Scanning Microscope, which combines features of an optical microscope, roughness gage, laser profilometer, and scanning electron microscope. It carries out noncontact surface profile, surface roughness, and thickness measurements without the need for sample preparation. By using a laser to scan across a target, this system can produce fullyfocused images with high resolution on nearly any type of material. The software module complies with ISO 25178 and allows users to complete measurements of several surface parameters. It provides 200–24,0009 magnification, with
J Fail. Anal. and Preven. (2013) 13:298–301
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VK-X Series 3D Laser Scanning Microscope from KEYENCE America
0.5 nm Z-axis resolution on almost any material. It has high-resolution, large depth-of-field observation, and profile and roughness measurements with zero sample preparation. It also measures thickness and uniformity of clear layers. There is no data loss, even on steep angles, and measurements can be made with a single click. For more information: KEYENCE America, 669 River Drive, Suite 403, Elmwood Park, NJ 07407; tel: 888/KEYENCE (888/539-3623); e-mail: [email protected]; web: www.keyence.com/products/microscope/laser/laser.php.
Materials Microscope Features High-Power LED Light, Built-in Oblique Illumination
The Leica DM2700M from Leica Microsystems, is a reliable materials microscope for a wide variety of applications such as metallography, earth science, forensic investigation, and materials quality control and
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