Product News
- PDF / 954,522 Bytes
- 6 Pages / 595.276 x 790.866 pts Page_size
- 30 Downloads / 213 Views
Product News
Ó ASM International 2020
Asylum Research Ergo Software Interface Simplifies Measurements for Jupiter XR AFM Oxford Instruments Asylum Research, Santa Barbara, CA, announces that the Jupiter XR atomic force microscope (AFM) now includes its new Ergo software interface. According to the company, Ergo’s intuitive guided workflow makes it even faster and simpler to set up, take measurements, and collect high-quality AFM images in both multi-user academic research and industrial research and development labs.
to AFM,’’ says Dr. Marta Kocun, Asylum Research product line manager. Jupiter XR is said to be the world’s fastest and highestresolution large-sample AFM, and the only one with blueDrive technology for unmatched measurement stability and repeatability A new short video is now available that introduces the Jupiter XR and provides an overview of the new Ergo interface. For more information: https://afm.oxinst.com/Jupiter.
Bruker’s E-Flash XS EBSD Detector Designed for Entry-Level Scanning Electron Microscopes
The Asylum Research Jupiter XR large-sample AFM and its new Ergo software interface
‘‘The new software interface perfectly complements Jupiter, making its performance and unique capabilities accessible to everyone, from experts to users who are new
Bruker, Berlin, introduces the e-Flash XS, a new electron backscatter diffraction (EBSD) detector which, for the first time, enables the characterization of the microstructure of crystalline materials in tabletop and other small, entry-level scanning electron microscopes (SEMs). Due to its innovative, patent-pending design, the e-Flash XS is the smallest and lightest EBSD detector currently available, yet with excellent performance. This makes it ideal for routine EBSD analysis in applications that do not require the use of high-end field emission SEMs. Designed for maximum reliability, ease of use, and EBSD pattern quality, the e-Flash XS is powered by a state-of-the-art complementary metal oxide semiconductor (CMOS) camera with 720 by 540 pixels native resolution, and the capability to use it in binning modes from 2 by 2 up to 6 by 6 pixels. Coupled with an innovative optical system for maximum light transmission and a high-performance, user-replaceable phosphor screen, the camera can acquire
123
J Fail. Anal. and Preven.
patterns at a speed of up to 525 frames per second even at moderate electron probe currents.
M125 C stereo microscope with FLEXACAM C1 microscope camera, and TL5000 Ergo transmitted light base
New e-Flash XS, the most reliable and most affordable EBSD detector
The USB3.0 interface for power supply and data transfer makes e-Flash XS a plug-and-play instrument. When not in use, the in-SEM portion of the EBSD detector can easily be removed by the operator for external storage to eliminate any risk of the SEM sample stage colliding with the detector. The new e-Flash XS EBSD detector is offered in combination with a specifically designed XFlash EDS detector, both fully integrated under Bruker’s ESPRIT 2 software suite, to crea
Data Loading...
