Product News
- PDF / 671,199 Bytes
- 3 Pages / 595.276 x 790.866 pts Page_size
- 54 Downloads / 191 Views
Product News
Ó ASM International 2020
Asylum Research Scanning Capacitance Microscopy Accessory Maps Dopant Amounts Oxford Instruments Asylum Research has released a new scanning capacitance microscopy (SCM) accessory for its Cypher and Jupiter XR atomic force microscopes (AFMs). The newly designed SCM module offers significantly higher performance and capability than anything available over the last 20 years. Unlike previous designs, it can measure not only differential capacitance (dC/dV), but also capacitance, which is linearly correlated with dopant levels. It can also image more than 20 times faster, producing high-quality datasets in as little as ten seconds. Higher sensitivity improves spatial resolution and allows it to be used on
a wider range of materials, including metals, insulators, and materials that do not form a native oxide layer. ‘‘Scanning capacitance microscopy has been something of misnomer until now because conventional SCM can only measure differential capacitance (dC/dV) and not actual capacitance,’’ commented Dominic Paszkeicz, director of product management at Oxford Instruments Asylum Research. ‘‘Asylum’s new SCM module changes that, directly mapping capacitance and making it simpler for users to interpret the results.’’ The Jupiter XR is a large-sample AFM that can accommodate samples up to 200 millimeters in diameter and scan sizes up to 100 microns, while still delivering ultra-high resolution and higher throughput, with typical images requiring less than one minute to acquire. For more information: https://afm.oxinst.com/SCM.
Edax Electron Backscatter Diffraction System Directly Measures Incident Electrons with No Need for Phosphors Edax has launched the world’s first commercially available direct electron detector designed for electron backscatter diffraction (EBSD). The Clarity system provides zero noise and zero distortion collection of EBSD patterns by directly measuring the incident electrons onto the detector. This approach removes the traditional phosphor and optics from the collection path, resulting in sharper EBSD patterns with higher sensitivity. Lower operating currents also benefit nonconductive samples such as ceramics, where electron charging effects disrupt analysis. Low-voltage operation reduces the interaction volume within the sample for an improved spatial resolution when working with nanomaterials. High-resolution electron backscatter diffraction and strain analysis are improved by the high-quality EBSD patterns collected.
Capacitance measurement using Asylum Research accessory
123
J Fail. Anal. and Preven.
EBSD orientation map collected with Clarity from an additively manufactured stainless steel sample showing deformation structure on average
Clarity can safely analyze beam-sensitive materials, such as perovskite solar cells, where higher beam currents damage the internal crystallographic structure and inhibit EBSD pattern detection. ‘‘The improved pattern quality made possible by the Clarity system raises intriguing possibilities in the area of cross-
Data Loading...
