A modified accelerated testing method of ELDRS in extreme-low dose rate irradiation
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A modified accelerated testing method of ELDRS in extreme-low dose rate irradiation Hang Zhou1,2 , Yu Song1,2 , Yang Liu1,2 , Ying Zhang1,2,a 1 Microsystem and Terahertz Research Center, China Academy of Engineering Physics, Chengdu, China 2 Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang, China
Received: 17 June 2020 / Accepted: 11 November 2020 © Società Italiana di Fisica and Springer-Verlag GmbH Germany, part of Springer Nature 2020
Abstract Low dose rate radiation induced gain degradation in bipolar devices is considered to be the primary threat to the spacecraft reliability and service life. In order to examine the radiation tolerance of bipolar devices, it is recommended to use 10 m rad(Si)/s as the typical dose rate in the standards MIL-STD-883G. There is lack of solid study to prove the dose rate is sufficient enough low. Our latest experiment results showed that the enhanced low dose rate sensitivity (ELDRS) effects was not saturated at 10 m rad(Si)/s. To examine the reliability of bipolar devices in extreme low dose rate environment below 10 m rad(Si)/s in short time, we proposed a modified accelerated testing method of ELDRS effects in extreme-low dose rate irradiation based on elevated temperature irradiation and temperature-switching during irradiation, which is helpful to get quantified results in the whole low dose rate range.
1 Introduction Most bipolar devices exhibit enhanced low dose rate sensitivity (ELDRS) effects in an ionizing radiation environment [1–6], which introduces unexpected safety risk to the electronic systems. Based on the requirement in MIL-STD-883G-1019.8, linear bipolar devices must be examined at a low dose rate (not exceeding 10 m rad(Si)/s) before they can be utilized in aerospace equipment. But this method is costly and time-consuming. In this case, several rapid and economical accelerated testing methods, such as (1) ETI methods [7], (2) High-Low Dose Rate Switching methods [8–11], (3) Hydrogen Soaking before irradiation methods [12–14], and (4) TSI methods [15–18] have been proposed. Some conservative results which utilized ETI and TSI methods are thought to be effective when the radiation dose rate is not lower than 10 m rad(Si)/s. However, our experimental results and many other references showed that the degradation at 10 m rad(Si)/s does not saturate [19–22].The nontrivial increase of the low dose rate enhancement factor (LDR EF) with the decrease of the dose rate below 10 m rad(Si)/s has been attracted much attentions in the literature. Hence the methods are required to extend the capability of the current accelerated testing methods to lower dose rate below 10 m rad(Si)/s. Here, we proposed a modified accelerated testing method of ELDRS effects in extremelow dose rate irradiation based on ETI and TSI, which is helpful to get more reliable and accurate results in whole low dose rate range.
a e-mail: [email protected] (corresponding author)
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