Broadband Quasi-Optical Dielectric Spectroscopy for Solid and Liquid Samples
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Broadband Quasi-Optical Dielectric Spectroscopy for Solid and Liquid Samples Xiaoming Liu 1,2
1
& Shuo Yu & Lu Gan
1,2
& Junsheng Yu
3
Received: 28 January 2020 / Accepted: 28 May 2020/ # Springer Science+Business Media, LLC, part of Springer Nature 2020
Abstract
Dielectric materials play a supporting role for electronic circuits. With the development of 5G millimeter wave communication, precision measurement of dielectric property becomes increasingly important. This paper introduces a free-space quasi-optical spectroscopy for complex dielectric property measurement. This spectroscopy can work in both transmission and reflection modes to accommodate both low-loss and high-loss materials. By applying the transfer matrix theory, both solid and liquid samples can be characterized using this system. In addition, the system employs a Gaussian telescope design, giving a possibility of broadband operation. Furthermore, this system is much simpler in calibration compared to other systems. A detailed description of the quasi-optical system is presented. Four materials are measured in the E-band (60–90 GHz). De-ionized water is also measured to represent liquid substrates in electronic circuits. The measurement is in good agreement with published data within a discrepancy of 5%. Keywords Dielectric property . Millimeter wave . Quasi-optical . Spectroscopy . Dual mode . Broadband
1 Introduction Millimeter wave (MM wave) has seen increasing applications in recent years, such as shortrange wireless communication at 60 GHz [1], automotive anti-collision radar at 77 GHz [2], and MM wave screening at 94 GHz [3]. With the coming of 5G MM wave communication, * Xiaoming Liu [email protected]
1
School of Physics and Electronic Information, Anhui Normal University, Wuhu 241002 Anhui, China
2
Anhui Provincial Engineering Laboratory on Information Fusion and Control of Intelligent Robot, Wuhu 241002 Anhui, China
3
School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China
Journal of Infrared, Millimeter, and Terahertz Waves
much attention has been drawn to the MM wave electronic devices and systems. In these systems, circuit substrates play a key role to the RF performance. For instance, the dielectric constant of the substrate is a critical factor to the resonating frequency of a microstrip antenna, and the loss tangent is influential to the gain of a microstrip antenna [4]. Knowledge of dielectric property is therefore a prior to RF components design. There are many methods for dielectric measurement, such as parallel plate method [5], transmission line method [6], open-ended probe method [7], free space method, and resonate method [8, 9]. However, the parallel plate method is not suitable for the MM wave range due to distributed parameters. The transmission line method requires the sample prepared to a length of λ/4, which is 1.25 mm at 60 GHz. Such a size will become more and more difficult for increasing operation frequency. The open-ended probe method is sui
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