Pattern Recognition and Information Forensics ICPR 2018 Internationa
This book constitutes the refereed post-conference proceedings of 3 workshops, held at the 24th International Conference on Pattern Recognition, Beijing, China, in August 2018: the Third International Workshop on Computer Vision for Analysis of Under
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Zhaoxiang Zhang · David Suter Yingli Tian · Alexandra Branzan Albu Nicolas Sidère · Hugo Jair Escalante (Eds.)
Pattern Recognition and Information Forensics ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA Beijing, China, August 20–24, 2018 Revised Selected Papers
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Lecture Notes in Computer Science Commenced Publication in 1973 Founding and Former Series Editors: Gerhard Goos, Juris Hartmanis, and Jan van Leeuwen
Editorial Board David Hutchison Lancaster University, Lancaster, UK Takeo Kanade Carnegie Mellon University, Pittsburgh, PA, USA Josef Kittler University of Surrey, Guildford, UK Jon M. Kleinberg Cornell University, Ithaca, NY, USA Friedemann Mattern ETH Zurich, Zurich, Switzerland John C. Mitchell Stanford University, Stanford, CA, USA Moni Naor Weizmann Institute of Science, Rehovot, Israel C. Pandu Rangan Indian Institute of Technology Madras, Chennai, India Bernhard Steffen TU Dortmund University, Dortmund, Germany Demetri Terzopoulos University of California, Los Angeles, CA, USA Doug Tygar University of California, Berkeley, CA, USA Gerhard Weikum Max Planck Institute for Informatics, Saarbrücken, Germany
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More information about this series at http://www.springer.com/series/7412
Zhaoxiang Zhang David Suter Yingli Tian Alexandra Branzan Albu Nicolas Sidère Hugo Jair Escalante (Eds.) •
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Pattern Recognition and Information Forensics ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA Beijing, China, August 20–24, 2018 Revised Selected Papers
123
Editors Zhaoxiang Zhang Chinese Academy of Sciences Beijing, China
Alexandra Branzan Albu University of Victoria Victoria, BC, Canada
David Suter University of Adelaide North Terrace, SA, Australia
Nicolas Sidère University of La Rochelle La Rochelle, France
Yingli Tian City College of New York New York, NY, USA
Hugo Jair Escalante National Institute of Astrophysics, Optics and Electronics Puebla, Mexico
ISSN 0302-9743 ISSN 1611-3349 (electronic) Lecture Notes in Computer Science ISBN 978-3-030-05791-6 ISBN 978-3-030-05792-3 (eBook) https://doi.org/10.1007/978-3-030-05792-3 Library of Congress Control Number: 2018964095 LNCS Sublibrary: SL6 – Image Processing, Computer Vision, Pattern Recognition, and Graphics © Springer Nature Switzerland AG 2019 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors, and the
