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With Dilatometer for up to 3000 °C: Graphite tube furnace with dilatometer accessory ramps from ambient température to 3000°C at 25C°/minute, and cools from 3000°C back to ambient in about two hours—allowing two runs a day. For opération at 3000 °C, the dilatometer can accommodate up to a 1-in. cube spécimen. A vertical stainless steel doublewalled chamber ensures that an isothermal zone surrounds the spécimen. A highresolution linear variable displacement transducer controls the coarse adjustment, while the fine adjustment is accomplished via the micrometer head. This arrangement allows for thermal expansion and ensures accuracy and repeatability to 0.0001. Furnace System with its state-of-the-art optical pyrometer température control and ail-digital instrumentation can be used to measure linear coefficients of expansion in advanced materials and to investigate the sintering behavior of ceramics. Centorr Furnaces, Route 28, Suncook, NH 032752399; (603)485-9504. Fully Automated Scanning Tunneling Microscope: Compact desktop System scans areas up to 10 x 10 ^m with a vertical resolution better than 0.01 nm; typical latéral resolution is 0.01 nm. The Tunnelscope 2400™ is highly automated. An operator simply places the spécimen on the microscope, defines the measurement parameters and starts the process. Coarse and fine positioning of the tip and resulting measurements are fully controlled by electronics. Specialized design gives the System a very high natural frequency, producing an extremely fast and stable scan, while the construction and use of résilient mounting help minimize distortion of measurements caused by factors such as température, vibration, and acoustic radiation. Struers, Inc., 26100 First Street, Westlake, Ohio 44145; (216) 871-0071.
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X-Ray Microanalysis System Laser Beam Analyzer: Portable 13pound, self-contained instrument provides real-time beam profile displays, 16 colors on beam profile contour plots, and X/Y cross-sectional views. Users can zoom or pan to beam profile areas of interest and use their own printers to record profiles for documentation and reports. Numerical beam calculations offer such standard features as beam energy, beam position, and beam dimensions, as well as Gaussian fit and Top Hat measurement. Users can also measure off-axis elliptical beams or square and rectangular Top Hats. In addition, ail thèse functions can be screened with pass/ fail limits. The analyzer is also easily interfaced to host computers for further data processing. Spiricon, Inc., 2600 North Main, Logan, Utah 84321; (801) 753-3729. Three-Dimensional Surface Profiler: Optical System combines advanced software algorithms with standard hardware components to achieve superior measurement quality at roughly half the total System cost of other phase measurement profilers. PROMAP achieves 0.5 ^m latéral resolution and sub-angstrom height resolution using standard turret mount microscope objectives and PC/AT compatible software. Analysis software is mouse driven for ease of use. Micromap, 4725 E. Sunrise Driv
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