Von Hippel Winner
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Oxford. A Fellow of the Royal Society and a Fellow of St Edmund Hall, Oxford, he also is Chairman of the United Kingdom Atomic Energy Authority. His Electron Microscopy of Thin Crystals, written with A. Howie, R.B. Nicholson, D.W. Pashley and M.J. Whelan and published in 1965, is the fundamental text on that subject, and his The Physics of Metals, Vol. II, Defects, is equally important. Society President H.J. Leamy said in announcing the award, "Hirsch and his
The Award The Materials Research Society's most prestigious award—and the premier honor in materials science—the Von Hippel Award, is presented to the living scientist who, in the Society's estimation, best exemplifies the originality, brilliance and diligence throughout a career that are the hallmark of science at its best; who adheres to the strictest ethical standards and highest code of professional integrity; and whose vision transcends conventional disciplines, as does the science of materials itself. The award is named for Arthur Robert von Hippel, Emeritus Professor of the Massachusetts Institute of Technology, who was also its first recipient. Annually, the Awards Committee of the MRS Council solicits nominations for the Von Hippel Award from among the membership and elsewhere in the community of materials
scientists. The nominees are evaluated against the Society's criteria, rather than against each other; i.e., the award need not be presented in any year in which a sufficiently outstanding scientist is not put forward. Contrariwise, only a single individual can receive the prize in any year; the recipient might be chosen from among a group of distinguished scientists, at least some of whom are destined to receive the award in subsequent years. From among the candidates it has reviewed, the Awards Committee puts forward the name of the individual it recommends, and the names of the other principal contenders for the honor. These nominees are considered in confidence by the senior officials of the Society and a recommendation made, also in confidence, to the Council itself. This body, representative of the many disciplines and institutions within the organization, makes the final selection.
PAGE 4, MRS BULLETIN, SEPTEMBER/OCTOBER 1983
PETER BERNHARD HIRSCH colleagues and students are largely to be credited with the elevation of the electron microscope to the preeminent position that the instrument now occupies in the study of the microstructure of materials. It is noteworthy that the Materials Research Society in its technical meetings has never failed to include among its offerings a session comprising the results of research with this instrument." Immediate Past President C.J.M. Northrup, Jr., Chairman of the Awards Committee which nominated Sir Peter, noted, "Hirsch is the first person to observe dislocation in transmission electron microscopy. The impact made by him and his students in the field of TEM study of imperfections in materials is enormous." Education Peter Bernhard Hirsch was born Jan. 16, 1925, to Ismar and Regina Hirsch. Educated
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