Retraction Note to: The effect of deposition pressure on the material properties of pulsed laser deposited BaAl 2 O 4 :E
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Retraction Note to: The effect of deposition pressure on the material properties of pulsed laser deposited BaAl2O4:Eu2+, Dy3+ thin films H. T. Haile1,* 1
and F. B. Dejene1
Department of Physics, University of the Free State, QwaQwa Campus, Private Bag X13, Phuthaditjhaba 9866, South Africa
Ó
Springer Science+Business
Media, LLC, part of Springer Nature 2020
Retraction Note to: Journal of Materials Science: Materials in Electronics (2019) 30:11851–11858 https://doi.org/10.1007/s10854-019-01484-w
acknowledgements in the Correction article without his consent. All authors agree to this retraction.
Reference The authors have retracted this article [1] due to the discovery of errors in the analysis of the smoothed XRD data. As the smoothed diffraction peaks would impact the crystal size and therefore the study’s results, the conclusions of the article are no longer viable. The authors apologize for this issue, and have been invited to re-submit their article with the correct data and analysis. The publisher regrets that Dr. P.E. Tomaszewski’s name was mentioned in
The original article can be found online at https:// doi.org/10.1007/s10854-019-01484-w.
Address correspondence to E-mail: [email protected]
https://doi.org/10.1007/s10854-020-04377-5
1. H.T. Haile, F.B. Dejene, The effect of deposition pressure on the material properties of pulsed laser deposited BaAl2O4:Eu2?, Dy3? thin films. J Mater Sci: Mater Electron 30, 11851–11858 (2019). https://doi.org/10.1007/s10854-019-014 84-w Publisher’s Note Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
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