Roadmap of Scanning Probe Microscopy
Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable pr
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NanoScience and Technology Series Editors: P. Avouris B. Bhushan D. Bimberg K. von Klitzing H. Sakaki R. Wiesendanger The series NanoScience and Technology is focused on the fascinating nano-world, mesoscopic physics, analysis with atomic resolution, nano and quantum-effect devices, nanomechanics and atomic-scale processes. All the basic aspects and technology-oriented developments in this emerging discipline are covered by comprehensive and timely books. The series constitutes a survey of the relevant special topics, which are presented by leading experts in the f ield. These books will appeal to researchers, engineers, and advanced students.
Noncontact Atomic Force Microscopy Editors: S. Morita, R. Wiesendanger, E. Meyer Nanoelectrodynamics Electrons and Electromagnetic Fields in Nanometer-Scale Structures Editor: H. Nejo Single Organic Nanoparticles Editors: H. Masuhara, H. Nakanishi, K. Sasaki Epitaxy of Nanostructures By V.A. Shchukin, N.N. Ledentsov and D. Bimberg Applied Scanning Probe Methods I Editors: B. Bhushan, H. Fuchs, S. Hosaka Nanostructures Theory and Modeling By C. Delerue and M. Lannoo Nanoscale Characterisation of Ferroelectric Materials Scanning Probe Microscopy Approach Editors: M. Alexe and A. Gruverman Magnetic Microscopy of Nanostructures Editors: H. Hopster and H.P. Oepen Silicon Quantum Integrated Circuits Silicon-Germanium Heterostructure Devices: Basics and Realisations By E. Kasper, D.J. Paul
The Physics of Nanotubes Fundamentals of Theory, Optics and Transport Devices Editors: S.V. Rotkin and S. Subramoney Single Molecule Chemistry and Physics An Introduction By C. Wang, C. Bai Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces By G. Kaupp Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods III Characterization Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods IV Industrial Application Editors: B. Bhushan, H. Fuchs Nanocatalysis Editors: U. Heiz, U. Landman Roadmap of Scanning Probe Microscopy Editor: S. Morita
S. Morita
(Ed.)
Roadmap of Scanning Probe Microscopy
With 96 Figures and 6 Tables
123
Professor Dr. Seizo Morita Graduate School of Engineering, Osaka University Department of Electrical, Electronic and Information Engineering Yamada-Oka 2-1, Suita 565-0871, Japan E-mail: [email protected]
Series Editors: Professor Dr. Phaedon Avouris
Professor Dr., Dres. h.c. Klaus von Klitzing
IBM Research Division Nanometer Scale Science & Technology Thomas J. Watson Research Center P.O. Box 218 Yorktown Heights, NY 10598, USA
Max-Planck-Institut f¨ur Festk¨orperforschung Heisenbergstr. 1 70569 Stuttgart, Germany
Professor Dr. Bharat Bhushan
University of Tokyo Institute of Industrial Science 4-6-1 Komaba, Meguro-ku Tokyo 153-8505, Japan
Ohio State University Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) Suite 255, Ackerman Road 650 Columbus, Ohio 43210, USA
Professor Dr. Diete
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