Low Temperature Scanning Probe Microscopy
This chapter is dedicated to scanning probe microscopy, one of the most important techniques in nanotechnology. In general, scanning probe techniques allow the measurement of physical properties down to the nanometer scale. Some techniques, such as the sc
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14. Low Temperature Scanning Probe Microscopy
14.1 Microscope Operation at Low Temperatures ............................ 14.1.1 Drift ........................................... 14.1.2 Noise .......................................... 14.1.3 Stability ...................................... 14.1.4 Piezo Relaxation and Hysteresis .....
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14.2 Instrumentation ................................... 415 14.2.1 A Simple Design for a Variable Temperature STM ...... 416 14.2.2 A Low Temperature SFM Based on a Bath Cryostat .............. 417 14.3 Scanning Tunneling Microscopy and Spectroscopy.................................. 14.3.1 Atomic Manipulation .................... 14.3.2 Imaging Atomic Motion................. 14.3.3 Detecting Light from Single Atoms and Molecules ... 14.3.4 High Resolution Spectroscopy ........ 14.3.5 Imaging Electronic Wave Functions. 14.3.6 Imaging Spin Polarization: Nanomagnetism ..........................
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14.4 Scanning Force Microscopy and Spectroscopy.................................. 14.4.1 Atomic-Scale Imaging................... 14.4.2 Force Spectroscopy ....................... 14.4.3 Electrostatic Force Microscopy ........ 14.4.4 Magnetic Force Microscopy ............
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References .................................................. 442
results obtained by scanning force microscopy, showing atomic-scale imaging on insulators, as well as force spectroscopy analysis. Finally, the magnetic force microscope, which images domain patterns in ferromagnets and vortex patterns in superconductors, is discussed. Although this list is far from complete, we feel that it gives an adequate impression of the fascinating possibilities of low-temperature scanning probe instruments. In this chapter low temperatures are defined as lower than about 100 K and are normally achieved by cooling with liquid nitrogen or liquid helium. Applications in which SPMs are operated close to 0 ◦ C are not covered in this chapter.
Part B 14
This chapter is dedicated to scanning probe microscopy, one of the most important techniques in nanotechnology. In general, scanning probe techniques allow the measurement of physical properties down to the nanometer scale. Some techniques, such as the scanning tunneling microscope and the scanning force microscope even go down to the atomic scale. The properties that are accessible are various. Most importantly, one can image the arrangement of atoms on conducting surfaces by scanning tunneling microscopy and on insulating substrates by scanning force microscopy. But also the arrangement of electrons (scanning tunneling spectroscopy), the force interaction between different atoms (scanning force spectroscopy), magnetic domains (magnetic force microscopy), the local capacitance (scanning capacitance microscopy), the local temperature (scanning thermo microscopy), and local light-induced excitations (scanning near-field microscopy) can be measured with high spatial resolution. In addition, some techniques even allow the ma
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