Silicon Photonics III Systems and Applications
This book is volume III of a series of books on silicon photonics. It reports on the development of fully integrated systems where many different photonics component are integrated together to build complex circuits. This is the demonstration of the fully
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Lorenzo Pavesi David J. Lockwood Editors
Silicon Photonics III Systems and Applications
Topics in Applied Physics Volume 122
Series editors Mildred S. Dresselhaus, Cambridge, MA, USA Young Pak Lee, Seoul, Korea, Republic of South Korea Paolo M. Ossi, Milan, Italy
Topics in Applied Physics is a well-established series of review books, each of which presents a comprehensive survey of a selected topic within the broad area of applied physics. Edited and written by leading research scientists in the field concerned, each volume contains review contributions covering the various aspects of the topic. Together these provide an overview of the state of the art in the respective field, extending from an introduction to the subject right up to the frontiers of contemporary research. Topics in Applied Physics is addressed to all scientists at universities and in industry who wish to obtain an overview and to keep abreast of advances in applied physics. The series also provides easy but comprehensive access to the fields for newcomers starting research. Contributions are specially commissioned. The Managing Editors are open to any suggestions for topics coming from the community of applied physicists no matter what the field and encourage prospective editors to approach them with ideas.
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Assistant Editor Adelheid H. Duhm Springer-Verlag GmbH Tiergartenstr. 17 69121 Heidelberg Germany [email protected]
More information about this series at http://www.springer.com/series/560
Lorenzo Pavesi David J. Lockwood •
Editors
Silicon Photonics III Systems and Applications
123
Editors Lorenzo Pavesi Nanoscience Laboratory Department of Physics University of Trento Povo, Trento Italy
ISSN 0303-4216 Topics in Applied Physics ISBN 978-3-642-10502-9 DOI 10.1007/978-3-642-10503-6
David J. Lockwood National Research Council of Canada Measurement Science and Standards Ottawa, ON Canada
ISSN 1437-0859
(electronic)
ISBN 978-3-642-10503-6
(eBook)
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