Spectroscopic Analysis of Optoelectronic Semiconductors
This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analyt
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Juan Jimenez Jens W. Tomm
Spectroscopic Analysis of Optoelectronic Semiconductors
Springer Series in Optical Sciences Volume 202
Founded by H.K.V. Lotsch Editor-in-Chief William T. Rhodes, Georgia Institute of Technology, Atlanta, USA Editorial Board Ali Adibi, Georgia Institute of Technology, Atlanta, USA Theodor W. Hänsch, Max-Planck-Institut für Quantenoptik, Garching, Germany Ferenc Krausz, Ludwig-Maximilians-Universität München, Garching, Germany Barry R. Masters, Cambridge, USA Katsumi Midorikawa, Saitama, Japan Herbert Venghaus, Fraunhofer Institut für Nachrichtentechnik, Berlin, Germany Horst Weber, Technische Universität Berlin, Berlin, Germany Harald Weinfurter, Ludwig-Maximilians-Universität München, Munchen, Germany
Springer Series in Optical Sciences The Springer Series in Optical Sciences, under the leadership of Editor-in-Chief William T. Rhodes, Georgia Institute of Technology, USA, provides an expanding selection of research monographs in all major areas of optics: lasers and quantum optics, ultrafast phenomena, optical spectroscopy techniques, optoelectronics, quantum information, information optics, applied laser technology, industrial applications, and other topics of contemporary interest. With this broad coverage of topics, the series is of use to all research scientists and engineers who need up-to-date reference books. The editors encourage prospective authors to correspond with them in advance of submitting a manuscript. Submission of manuscripts should be made to the Editor-in-Chief or one of the Editors. See also www.springer.com/series/624
More information about this series at http://www.springer.com/series/624
Juan Jimenez Jens W. Tomm •
Spectroscopic Analysis of Optoelectronic Semiconductors
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Juan Jimenez Condensed Matter Physics University of Valladolid Valladolid Spain
Jens W. Tomm Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie Berlin Germany
ISSN 0342-4111 ISSN 1556-1534 (electronic) Springer Series in Optical Sciences ISBN 978-3-319-42347-0 ISBN 978-3-319-42349-4 (eBook) DOI 10.1007/978-3-319-42349-4 Library of Congress Control Number: 2016945144 © Springer International Publishing Switzerland 2016 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed
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