Synchrotron Radiation Induced X-Ray Microfluorescence Analysis
μ-XRF is the microscopic equivalent of the well-established multielement analytical technique. In this paper, after comparing the interaction of X-ray photons, electrons and protons with matter and an introduction to synchrotron rings and microfocussing o
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Synchrotron Radiation Induced X-Ray Microfluorescence Analysis K. Janssens l ,*, L. Vincze l , B. Vekemans, A. Aerts l , F. Adams!, K. W. Jones 2 , and A. KnocheF 1 2
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Department of Chemistry, University of Antwerp (UIA), B-2610 Antwerp, Belgium Department of Applied Sciences, Brookhaven National Laboratories, Upton 11973, NY, USA Department of Chemistry, Universitat Hamburg, D-20146 Hamburg, Federal Republic of Germany
Abstract. Il-XRF is the microscopic equivalent of the well-established multielement analytical technique. In this paper, after comparing the interaction of X-ray photons, electrons and protons with matter and an introduction to synchrotron rings and microfocussing of X-rays, the instrumentation for Il-XRF is discussed, both for laboratory source and synchrotron based setups and the analytical characteristics of Il-XRF are contrasted to that of other microanalytical techniques. Also, this issue of quantification of Il-XRF data is addressed; the applicability of the method in archeological and geological analysis is illustrated. Key words: synchrotron radiation, microscopic X-ray fluorescence analysis, X-ray fluorescence analysis, trace elements, procelain analysis, fluid inclusions, archeological glass. 1. Introduction 2. Theoretical Background Interaction of X-Ray Photons, Electrons and Protons with Matter Tube-Excited vs. Synchrotron Radiation Microfocussing of X-Ray Beams 3. Instrumentation for fl-XRF Laboratory Scale fl-XRF Spectrometers Synchrotron XRF Spectrometers Analytical Characteristics of fl-(SR)XRF vs. other Microanalytical Techniques 4. Quantitative Microanalysis Using fl-(SR)XRF Quantification of Conventional XRF Data Quantification Problems Associated with SR-XRF Data Quantification of fl-XRF Line-Scans and Image Data 5. Applications Corrosion of Roman Glass Non-destructive Analysis of Fluid Inclusions in Quartz Dating/authentification of Chinese Procelain 6. Summary References
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To whom correspondence should be addressed
D. Benoit et al. (eds.), Microbeam and Nanobeam Analysis © Springer-Verlag Wien 1996
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K. Janssens et al.
1. Introduction One of the most widely applied analytical technologies that makes use of X-rays, both as a means of excitation and as analytical signal is X-ray fluorescence analysis (XRF) [1-3]. Although the basis of qualitative and quantitative X-ray spectrometry was already established by Mosely in 1913, only with the introduction of the first commercial X-ray spectrometry instrument in 1948, XRF started towards becoming a standard multi-element analytical technique present in many research and industrial laboratories. The worldwide number of XRF instruments today is approximately 18000 units. This equipment is mostly used for routine bulk elemental analysis of a variety of materials (e.g., steel, polymers, ceramics, raw materials in the microelectronics industry ... ) and is often used for quality control of start- or finished products. For a number of years, however, XRF had been considered as a very useful, but not a very modern technique. Develo
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