Test Technology Newsletter
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Test Technology Newsletter December 2020 The Newsletter of the Test Technology Technical Council of the IEEE Computer Society Editor: Theo Theocharides
PAST TTTC EVENTS The 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20) 19–21 October, 2020 Rome, ITALY http://www.dfts.org/ DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest. Topics include (but are not limited to) the following: Yield Analysis and Modeling; Testing Techniques; Design For Testability in IC Design; Error Detection, Correction, and Recovery; Dependability Analysis and Validation; Repair, Restructuring and Reconfiguration; Defect and Fault Tolerance; Radiation effects; Aging and Lifetime Reliability; Dependable Applications and Case Studies; Emerging Technologies; Design for Security. The IEEE International Test Conference (ITC 2020) 3–5 November, 2020 Washington, D.C., USA – Virtual Conference http://www.itctestweek.org/about-itc/ International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design
verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. At ITC, design, test, and yield professionals can confront challenges faced by the industry and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. ITC, the cornerstone of the Test Week event, offers a wide variety of technical activities targeted at test and design theoreticians and practitioners, including: formal paper sessions, tutorials, panel sessions, case studies, invited lectures, commercial exhibits and presentations, and a host of ancillary professional meetings. The 5th Automotive Reliability and Test Workshop 6 November, 2020 Washington, D.C., USA – Virtual Workshop http://cas.polito.it/ART2020/ The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety, and cost constraints of a mass market, the reliable operation of electronics in safety-critical do
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