The design and implementation of a robust single-layer QCA ALU using a novel fault-tolerant three-input majority gate
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The design and implementation of a robust single‑layer QCA ALU using a novel fault‑tolerant three‑input majority gate Seyed‑Sajad Ahmadpour1 · Mohammad Mosleh1 · Saeed Rasouli Heikalabad2
© Springer Science+Business Media, LLC, part of Springer Nature 2020
Abstract Inverter and majority gates are considered as two important primitive gates for designing logical circuits in the quantum-dot cellular automata (QCA) technology. Up to now, many QCA layouts have been introduced for three-input majority gates, most of which are not robust against the QCA defects and so they are prone to faults. In this paper, we propose an efficient fault-tolerant 3-input majority gate with ten simple and rotated cells whose output signal strength is very high (± 9.93e−001). The fault tolerance of the proposed structure is investigated against cell omission, extra-cell deposition, and displacement defects. The results show that the proposed structure is 100% and 90% tolerant against single-cell omission and extra-cell deposition defects. Moreover, the error probability of the proposed gate under cell omission and extra-cell deposition defects is investigated through analytical modeling. Using the proposed fault-tolerant structure, two basic circuits including a fault-tolerant QCA full-adder and a fault-tolerant 2:1 QCA multiplexer are introduced. Finally, using the proposed circuits, a fault-tolerant one-bit arithmetic logic unit with four mathematical and logical operations is designed and implemented. To verify the proposed three-input majority gate, some physical proofs are provided. The results of simulations by QCADesigner 2.0.3 show that the proposed circuits work well. The power analysis of the proposed structure is performed using a QCAPro tool. The comparison results show that the proposed circuits are much better than the previous designs. Keywords Circuits design · Nanotechnology · Fault-tolerant · Quantum-dot cellular automata · Three-input majority gate · Reliability
* Mohammad Mosleh [email protected] 1
Department of Computer Engineering, Dezful Branch, Islamic Azad University, Dezful, Iran
2
Department of Computer Engineering, Tabriz Branch, Islamic Azad University, Tabriz, Iran
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1 Introduction In previous decades, CMOS played a fundamental role in the implementation of integrated circuits with high density, low power, and high speed. The scalability of CMOS technology is reaching the end that enables the development of nanomolecular instruments. Spintronics [1] and quantum-dot cellular automata (QCA) [2–5] are the technologies introduced for CMOS replacement. Considering the measures of the occupied area, delay, and power consumption, the QCA technology can be the best candidate for the replacement of CMOS [6–10]. The QCA technology was introduced in 1993 by Lent et al. [11]. Specific features of QCA technology such as lower density, very fast switching time, and low power consumption compared to CMOS made it an interesting research topic. In the QCA technology,
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