Fault-Tolerance Techniques for SRAM-based FPGAs
Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The co
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FRET 32 FRONTIERS IN ELECTRONIC TESTING
Fernanda Lima Kastensmidt Luigi Carro Ricardo Reis
Fault-Tolerance Techniques for SRAM-based FPGAs A B3
FAULT-TOLERANCE TECHNIQUES FOR SRAM-BASED FPGAS
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FRONTIERS IN ELECTRONIC TESTING Consulting Editor Vishwani D. Agrawal Books in the series: Data Mining and Diagnosing IC Fails Huisman, L.M., Vol. 31 ISBN: 0-387-24993-1 Fault Diagnosis of Analog Integrated Circuits Kabisatpathy, P., Barua, A. (et al.), Vol. 30 ISBN: 0-387-25742-X Introduction to Advanced System-on-Chip Test Design and Optimi... Larsson, E., Vol. 29 ISBN: 1-4020-3207-2 Embedded Processor-Based Self-Test Gizopoulos, D. (et al.), Vol. 28 ISBN: 1-4020-2785-0 Advances in Electronic Testing Gizopoulos, D. (et al.), Vol. 27 ISBN: 0-387-29408-2 Testing Static Random Access Memories Hamdioui, S., Vol. 26 ISBN: 1-4020-7752-1 Verification by Error Modeling Radecka, K. and Zilic, Vol. 25 ISBN: 1-4020-7652-5 Elements of STIL: Principles and Applications of IEEE Std. 1450 Maston, G., Taylor, T. (et al.), Vol. 24 ISBN: 1-4020-7637-1 Fault Injection Techniques and Tools for Embedded systems Reliability … Benso, A., Prinetto, P. (Eds.), Vol. 23 ISBN: 1-4020-7589-8 Power-Constrained Testing of VLSI Circuits Nicolici, N., Al-Hashimi, B.M., Vol. 22B ISBN: 1-4020-7235-X High Performance Memory Testing Adams, R. Dean, Vol. 22A ISBN: 1-4020-7255-4 SOC (System-on-a-Chip) Testing for Plug and Play Test Automation Chakrabarty, K. (Ed.), Vol. 21 ISBN: 1-4020-7205-8 Test Resource Partitioning for System-on-a-Chip Chakrabarty, K., Iyengar & Chandra (et al.), Vol. 20 ISBN: 1-4020-7119-1 A Designers , Guide to Built-in Self-Test Stroud, C., Vol. 19 ISBN: 1-4020-7050-0 Boundary-Scan Interconnect Diagnosis de Sousa, J., Cheung, P.Y.K., Vol. 18 ISBN: 0-7923-7314-6 Essentials of Electronic Testing for Digital, Memory, and Mixed Signal VLSI Circuits Bushnell, M.L., Agrawal, V.D., Vol. 17 ISBN: 0-7923-7991-8 Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test … Osseiran, A. (Ed.), Vol. 16 ISBN: 0-7923-8686-8
FAULT-TOLERANCE TECHNIQUES FOR SRAM-BASED FPGAS
by
FERNANDA LIMA KASTENSMIDT UFRGS, Instituto de Informatica, Porto Alegre, Brazil
LUIGI CARRO
UFRGS, Departamento de Engenharia Eletrica, Porto Alegre, Brazil and
RICARDO REIS UFRGS, Instituto de Informatica, Porto Alegre, Brazil
A C.I.P. Catalogue record for this book is available from the Library of Congress.
ISBN-10 ISBN-13 ISBN-10 ISBN-13
0-387-31068-1 (HB) 978-0-387-31068-8 (HB) 0-387-31069-X (e-book) 978-0-387-31069-5 (e-book)
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